JPS6041729Y2 - ウエハプロ−ブカ−ド - Google Patents
ウエハプロ−ブカ−ドInfo
- Publication number
- JPS6041729Y2 JPS6041729Y2 JP3627879U JP3627879U JPS6041729Y2 JP S6041729 Y2 JPS6041729 Y2 JP S6041729Y2 JP 3627879 U JP3627879 U JP 3627879U JP 3627879 U JP3627879 U JP 3627879U JP S6041729 Y2 JPS6041729 Y2 JP S6041729Y2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- wiring
- probe card
- probe
- card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3627879U JPS6041729Y2 (ja) | 1979-03-19 | 1979-03-19 | ウエハプロ−ブカ−ド |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3627879U JPS6041729Y2 (ja) | 1979-03-19 | 1979-03-19 | ウエハプロ−ブカ−ド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55135985U JPS55135985U (OSRAM) | 1980-09-27 |
| JPS6041729Y2 true JPS6041729Y2 (ja) | 1985-12-19 |
Family
ID=28897136
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3627879U Expired JPS6041729Y2 (ja) | 1979-03-19 | 1979-03-19 | ウエハプロ−ブカ−ド |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6041729Y2 (OSRAM) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2576233Y2 (ja) * | 1991-08-05 | 1998-07-09 | 株式会社アドバンテスト | Ic試験装置のテストヘッドと試料との接続機構 |
-
1979
- 1979-03-19 JP JP3627879U patent/JPS6041729Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55135985U (OSRAM) | 1980-09-27 |
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