JPS55135985U - - Google Patents

Info

Publication number
JPS55135985U
JPS55135985U JP3627879U JP3627879U JPS55135985U JP S55135985 U JPS55135985 U JP S55135985U JP 3627879 U JP3627879 U JP 3627879U JP 3627879 U JP3627879 U JP 3627879U JP S55135985 U JPS55135985 U JP S55135985U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3627879U
Other languages
Japanese (ja)
Other versions
JPS6041729Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3627879U priority Critical patent/JPS6041729Y2/ja
Publication of JPS55135985U publication Critical patent/JPS55135985U/ja
Application granted granted Critical
Publication of JPS6041729Y2 publication Critical patent/JPS6041729Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3627879U 1979-03-19 1979-03-19 ウエハプロ−ブカ−ド Expired JPS6041729Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3627879U JPS6041729Y2 (ja) 1979-03-19 1979-03-19 ウエハプロ−ブカ−ド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3627879U JPS6041729Y2 (ja) 1979-03-19 1979-03-19 ウエハプロ−ブカ−ド

Publications (2)

Publication Number Publication Date
JPS55135985U true JPS55135985U (OSRAM) 1980-09-27
JPS6041729Y2 JPS6041729Y2 (ja) 1985-12-19

Family

ID=28897136

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3627879U Expired JPS6041729Y2 (ja) 1979-03-19 1979-03-19 ウエハプロ−ブカ−ド

Country Status (1)

Country Link
JP (1) JPS6041729Y2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0515431U (ja) * 1991-08-05 1993-02-26 株式会社アドバンテスト Ic試験装置のテストヘツドと試料との接続機構

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0515431U (ja) * 1991-08-05 1993-02-26 株式会社アドバンテスト Ic試験装置のテストヘツドと試料との接続機構

Also Published As

Publication number Publication date
JPS6041729Y2 (ja) 1985-12-19

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