JPS60207363A - 半導体装置 - Google Patents

半導体装置

Info

Publication number
JPS60207363A
JPS60207363A JP59063567A JP6356784A JPS60207363A JP S60207363 A JPS60207363 A JP S60207363A JP 59063567 A JP59063567 A JP 59063567A JP 6356784 A JP6356784 A JP 6356784A JP S60207363 A JPS60207363 A JP S60207363A
Authority
JP
Japan
Prior art keywords
substrate
dielectric
semiconductor
silicon
semiconductor layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59063567A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0147019B2 (enrdf_load_stackoverflow
Inventor
Toshiro Usami
俊郎 宇佐美
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59063567A priority Critical patent/JPS60207363A/ja
Publication of JPS60207363A publication Critical patent/JPS60207363A/ja
Priority to US07/206,903 priority patent/US4879585A/en
Publication of JPH0147019B2 publication Critical patent/JPH0147019B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0165Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/7624Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
    • H01L21/76264SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
    • H01L21/76272Vertical isolation by lateral overgrowth techniques, i.e. ELO techniques

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Element Separation (AREA)
JP59063567A 1984-03-31 1984-03-31 半導体装置 Granted JPS60207363A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP59063567A JPS60207363A (ja) 1984-03-31 1984-03-31 半導体装置
US07/206,903 US4879585A (en) 1984-03-31 1988-06-15 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59063567A JPS60207363A (ja) 1984-03-31 1984-03-31 半導体装置

Publications (2)

Publication Number Publication Date
JPS60207363A true JPS60207363A (ja) 1985-10-18
JPH0147019B2 JPH0147019B2 (enrdf_load_stackoverflow) 1989-10-12

Family

ID=13232945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59063567A Granted JPS60207363A (ja) 1984-03-31 1984-03-31 半導体装置

Country Status (1)

Country Link
JP (1) JPS60207363A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01155655A (ja) * 1987-12-14 1989-06-19 Hitachi Ltd 半導体集積回路
JPH0338857A (ja) * 1989-06-30 1991-02-19 Honeywell Inc 半導体装置および半導体分離構造を製造する方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01155655A (ja) * 1987-12-14 1989-06-19 Hitachi Ltd 半導体集積回路
JPH0338857A (ja) * 1989-06-30 1991-02-19 Honeywell Inc 半導体装置および半導体分離構造を製造する方法

Also Published As

Publication number Publication date
JPH0147019B2 (enrdf_load_stackoverflow) 1989-10-12

Similar Documents

Publication Publication Date Title
US3849216A (en) Method of manufacturing a semiconductor device and semiconductor device manufactured by using the method
US3518506A (en) Semiconductor device with contact metallurgy thereon,and method for making same
JPS60501083A (ja) 半導体装置の製造方法
KR910009783B1 (ko) 반도체 장치의 제조방법
JPH02256267A (ja) 薄膜soi c―mos素子及びその製造方法
US3789503A (en) Insulated gate type field effect device and method of making the same
JPS6038866A (ja) 金属―酸化膜―半導体集積回路の製造方法
EP0031367A1 (en) METHOD FOR FORMING A VOLTAGE INVARIANT CAPACITOR FOR A MOS INTEGRATED CIRCUIT DEVICE.
US4081896A (en) Method of making a substrate contact for an integrated circuit
JPS5843912B2 (ja) 半導体集積回路装置の製造方法
JPS60207363A (ja) 半導体装置
EP0076147B1 (en) Method of producing a semiconductor device comprising an isolation region
US4512076A (en) Semiconductor device fabrication process
JPS5885560A (ja) 集積回路構成方法
US3776786A (en) Method of producing high speed transistors and resistors simultaneously
JPH0210730A (ja) 集積回路チップ上の電界効果トランジスタ用のフィールド・アイソレーション形成方法と構造
JPH0465528B2 (enrdf_load_stackoverflow)
JP3156001B2 (ja) 半導体装置の製造方法
JPH06302791A (ja) 半導体基板及びその製造方法
US3783048A (en) High frequency transistor fabrication
JPS594137A (ja) 半導体装置の製造方法
JPH0744231B2 (ja) 半導体集積回路およびその製造方法
JPS61156830A (ja) 半導体装置およびその製造方法
JPS60133740A (ja) 半導体装置の製造方法
JPS5928993B2 (ja) 半導体装置とその製造方法

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term