JPS60173647A - 情報処理装置のエラ−発生箇所検出方式 - Google Patents

情報処理装置のエラ−発生箇所検出方式

Info

Publication number
JPS60173647A
JPS60173647A JP59029020A JP2902084A JPS60173647A JP S60173647 A JPS60173647 A JP S60173647A JP 59029020 A JP59029020 A JP 59029020A JP 2902084 A JP2902084 A JP 2902084A JP S60173647 A JPS60173647 A JP S60173647A
Authority
JP
Japan
Prior art keywords
error
correction pattern
memory
register
error correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59029020A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0377546B2 (enrdf_load_stackoverflow
Inventor
Masami Wakabayashi
正美 若林
Takayuki Kimura
隆之 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59029020A priority Critical patent/JPS60173647A/ja
Publication of JPS60173647A publication Critical patent/JPS60173647A/ja
Publication of JPH0377546B2 publication Critical patent/JPH0377546B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/079—Root cause analysis, i.e. error or fault diagnosis
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0409—Online test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP59029020A 1984-02-17 1984-02-17 情報処理装置のエラ−発生箇所検出方式 Granted JPS60173647A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59029020A JPS60173647A (ja) 1984-02-17 1984-02-17 情報処理装置のエラ−発生箇所検出方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59029020A JPS60173647A (ja) 1984-02-17 1984-02-17 情報処理装置のエラ−発生箇所検出方式

Publications (2)

Publication Number Publication Date
JPS60173647A true JPS60173647A (ja) 1985-09-07
JPH0377546B2 JPH0377546B2 (enrdf_load_stackoverflow) 1991-12-10

Family

ID=12264726

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59029020A Granted JPS60173647A (ja) 1984-02-17 1984-02-17 情報処理装置のエラ−発生箇所検出方式

Country Status (1)

Country Link
JP (1) JPS60173647A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62226354A (ja) * 1986-03-28 1987-10-05 Mitsubishi Electric Corp Ｒａｓ回路付記憶装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542343A (en) * 1978-09-19 1980-03-25 Fujitsu Ltd Control system for memory unit
JPS5668999A (en) * 1979-11-09 1981-06-09 Nec Corp Memory device
JPS5693196A (en) * 1979-12-26 1981-07-28 Fujitsu Ltd Error detecting system of checking circuit
JPS56163599A (en) * 1980-05-19 1981-12-16 Nec Corp Storage device
JPS58224500A (ja) * 1982-06-23 1983-12-26 Fujitsu Ltd メモリ間欠障害救済方式

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542343A (en) * 1978-09-19 1980-03-25 Fujitsu Ltd Control system for memory unit
JPS5668999A (en) * 1979-11-09 1981-06-09 Nec Corp Memory device
JPS5693196A (en) * 1979-12-26 1981-07-28 Fujitsu Ltd Error detecting system of checking circuit
JPS56163599A (en) * 1980-05-19 1981-12-16 Nec Corp Storage device
JPS58224500A (ja) * 1982-06-23 1983-12-26 Fujitsu Ltd メモリ間欠障害救済方式

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62226354A (ja) * 1986-03-28 1987-10-05 Mitsubishi Electric Corp Ｒａｓ回路付記憶装置

Also Published As

Publication number Publication date
JPH0377546B2 (enrdf_load_stackoverflow) 1991-12-10

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