JPS60171543A - マイクロプロセツサ故障解折装置 - Google Patents

マイクロプロセツサ故障解折装置

Info

Publication number
JPS60171543A
JPS60171543A JP59026588A JP2658884A JPS60171543A JP S60171543 A JPS60171543 A JP S60171543A JP 59026588 A JP59026588 A JP 59026588A JP 2658884 A JP2658884 A JP 2658884A JP S60171543 A JPS60171543 A JP S60171543A
Authority
JP
Japan
Prior art keywords
under test
microprocessor
board under
probe
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59026588A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6363928B2 (enrdf_load_stackoverflow
Inventor
Kenichiro Kuno
久野 賢一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp filed Critical Yokogawa Hokushin Electric Corp
Priority to JP59026588A priority Critical patent/JPS60171543A/ja
Publication of JPS60171543A publication Critical patent/JPS60171543A/ja
Publication of JPS6363928B2 publication Critical patent/JPS6363928B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/261Functional testing by simulating additional hardware, e.g. fault simulation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP59026588A 1984-02-15 1984-02-15 マイクロプロセツサ故障解折装置 Granted JPS60171543A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59026588A JPS60171543A (ja) 1984-02-15 1984-02-15 マイクロプロセツサ故障解折装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59026588A JPS60171543A (ja) 1984-02-15 1984-02-15 マイクロプロセツサ故障解折装置

Publications (2)

Publication Number Publication Date
JPS60171543A true JPS60171543A (ja) 1985-09-05
JPS6363928B2 JPS6363928B2 (enrdf_load_stackoverflow) 1988-12-09

Family

ID=12197699

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59026588A Granted JPS60171543A (ja) 1984-02-15 1984-02-15 マイクロプロセツサ故障解折装置

Country Status (1)

Country Link
JP (1) JPS60171543A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2712117A1 (fr) * 1993-11-05 1995-05-12 Nec Corp Dispositif de commutation de fonction pour appareil de traitement d'information.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2712117A1 (fr) * 1993-11-05 1995-05-12 Nec Corp Dispositif de commutation de fonction pour appareil de traitement d'information.
US5571998A (en) * 1993-11-05 1996-11-05 Nec Corporation Function switching device for information processing apparatus

Also Published As

Publication number Publication date
JPS6363928B2 (enrdf_load_stackoverflow) 1988-12-09

Similar Documents

Publication Publication Date Title
US6263305B1 (en) Software development supporting system and ROM emulation apparatus
JPS60171543A (ja) マイクロプロセツサ故障解折装置
CN117033050A (zh) 状态信息的发送方法、系统、存储介质及电子设备
CN108809754A (zh) 一种BMC下的TF Card信号完整性测试系统及方法
JPS62281034A (ja) 装置試験方式
JPS61112247A (ja) デ−タ処理装置
JPH0399334A (ja) プログラム・ダウンロード式エミュレータ
JP2998439B2 (ja) 回線制御装置
JPH0137772B2 (enrdf_load_stackoverflow)
JPH031399A (ja) 記憶装置
JPS6123263A (ja) 試験方式
JPH02201517A (ja) ケーブル接続確認方式
JPH0277986A (ja) 半導体集積回路及びエミュレータ
CN116450426A (zh) 一种数据获取方法、装置、设备、系统及存储介质
JPH01184550A (ja) 中間制御装置のテスト回路
JPH04192040A (ja) デバッグ装置
JPH0827740B2 (ja) デ−タ処理装置
JPS6197579A (ja) マイクロプロセツサを使用した製品の試験方法
US20030220782A1 (en) Configuration for in-circuit emulation of a program-controlled unit
JPS6027054B2 (ja) 入出力制御方式
JPH0512054A (ja) システム開発装置
JPS6385832A (ja) パリテイチエツク方式
JPS6123250A (ja) 試験方式
JPS63180138A (ja) Cpu切替方式
JPH0496831A (ja) マイクロプロセッサ周辺回路検査装置