JPS60157230A - 半導体ウエハ搬送方法 - Google Patents
半導体ウエハ搬送方法Info
- Publication number
- JPS60157230A JPS60157230A JP59003049A JP304984A JPS60157230A JP S60157230 A JPS60157230 A JP S60157230A JP 59003049 A JP59003049 A JP 59003049A JP 304984 A JP304984 A JP 304984A JP S60157230 A JPS60157230 A JP S60157230A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- wafers
- cassette
- semiconductor
- wafer cassette
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H10P72/0608—
-
- H10P72/50—
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59003049A JPS60157230A (ja) | 1984-01-11 | 1984-01-11 | 半導体ウエハ搬送方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59003049A JPS60157230A (ja) | 1984-01-11 | 1984-01-11 | 半導体ウエハ搬送方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60157230A true JPS60157230A (ja) | 1985-08-17 |
| JPH0566734B2 JPH0566734B2 (enExample) | 1993-09-22 |
Family
ID=11546455
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59003049A Granted JPS60157230A (ja) | 1984-01-11 | 1984-01-11 | 半導体ウエハ搬送方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60157230A (enExample) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6390843U (enExample) * | 1986-12-03 | 1988-06-13 | ||
| JPS6426844U (enExample) * | 1987-08-11 | 1989-02-15 | ||
| US4886412A (en) * | 1986-10-28 | 1989-12-12 | Tetron, Inc. | Method and system for loading wafers |
| JPH02142157A (ja) * | 1988-11-22 | 1990-05-31 | Nippon M R C Kk | ウェハーの有無・傾き判別装置 |
| NL1032069C2 (nl) * | 2006-06-28 | 2008-01-02 | Meco Equip Eng | Inrichting voor het in een bad behandelen van een plaatvormig substraat. |
| US20110205354A1 (en) * | 2008-10-01 | 2011-08-25 | Kawasaki Jukogyo Kabushiki Kaisha | Apparatus and method for detecting substrates |
| CN107131825A (zh) * | 2017-03-24 | 2017-09-05 | 北京工业大学 | 一种判别并记录硅片位置的检测装置及方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53129963A (en) * | 1977-04-20 | 1978-11-13 | Hitachi Ltd | Wafer appearance inspection apparatus |
| JPS56120124A (en) * | 1980-02-26 | 1981-09-21 | Nippon Telegr & Teleph Corp <Ntt> | Wafer replacement device |
-
1984
- 1984-01-11 JP JP59003049A patent/JPS60157230A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53129963A (en) * | 1977-04-20 | 1978-11-13 | Hitachi Ltd | Wafer appearance inspection apparatus |
| JPS56120124A (en) * | 1980-02-26 | 1981-09-21 | Nippon Telegr & Teleph Corp <Ntt> | Wafer replacement device |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4886412A (en) * | 1986-10-28 | 1989-12-12 | Tetron, Inc. | Method and system for loading wafers |
| JPS6390843U (enExample) * | 1986-12-03 | 1988-06-13 | ||
| JPS6426844U (enExample) * | 1987-08-11 | 1989-02-15 | ||
| JPH02142157A (ja) * | 1988-11-22 | 1990-05-31 | Nippon M R C Kk | ウェハーの有無・傾き判別装置 |
| NL1032069C2 (nl) * | 2006-06-28 | 2008-01-02 | Meco Equip Eng | Inrichting voor het in een bad behandelen van een plaatvormig substraat. |
| WO2008023974A1 (en) * | 2006-06-28 | 2008-02-28 | Meco Equipment Engineers B.V. | Device for treating a plate-shaped substrate in a bath. |
| US20110205354A1 (en) * | 2008-10-01 | 2011-08-25 | Kawasaki Jukogyo Kabushiki Kaisha | Apparatus and method for detecting substrates |
| US9202732B2 (en) * | 2008-10-01 | 2015-12-01 | Kawasaki Jukogyo Kabushiki Kaisha | Apparatus and method for detecting substrates |
| CN107131825A (zh) * | 2017-03-24 | 2017-09-05 | 北京工业大学 | 一种判别并记录硅片位置的检测装置及方法 |
| CN107131825B (zh) * | 2017-03-24 | 2019-08-09 | 北京工业大学 | 一种判别并记录硅片位置的检测装置及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0566734B2 (enExample) | 1993-09-22 |
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