JPS60144937A - アライメントマ−クの検出装置 - Google Patents
アライメントマ−クの検出装置Info
- Publication number
- JPS60144937A JPS60144937A JP59000488A JP48884A JPS60144937A JP S60144937 A JPS60144937 A JP S60144937A JP 59000488 A JP59000488 A JP 59000488A JP 48884 A JP48884 A JP 48884A JP S60144937 A JPS60144937 A JP S60144937A
- Authority
- JP
- Japan
- Prior art keywords
- alignment mark
- wafer
- marks
- output
- alignment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59000488A JPS60144937A (ja) | 1984-01-05 | 1984-01-05 | アライメントマ−クの検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59000488A JPS60144937A (ja) | 1984-01-05 | 1984-01-05 | アライメントマ−クの検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60144937A true JPS60144937A (ja) | 1985-07-31 |
| JPH0550128B2 JPH0550128B2 (enrdf_load_stackoverflow) | 1993-07-28 |
Family
ID=11475149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59000488A Granted JPS60144937A (ja) | 1984-01-05 | 1984-01-05 | アライメントマ−クの検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60144937A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62155532A (ja) * | 1985-12-27 | 1987-07-10 | Nec Corp | 半導体ウエ−ハの位置合せマ−クの形成方法 |
| JPH0430414A (ja) * | 1990-05-25 | 1992-02-03 | Matsushita Electric Ind Co Ltd | 位置決め装置 |
| JP2009533702A (ja) * | 2006-04-11 | 2009-09-17 | マイクロニック レーザー システムズ アクチボラゲット | 位置合わせ方法及びそのための装置 |
-
1984
- 1984-01-05 JP JP59000488A patent/JPS60144937A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62155532A (ja) * | 1985-12-27 | 1987-07-10 | Nec Corp | 半導体ウエ−ハの位置合せマ−クの形成方法 |
| JPH0430414A (ja) * | 1990-05-25 | 1992-02-03 | Matsushita Electric Ind Co Ltd | 位置決め装置 |
| US5194744A (en) * | 1990-05-25 | 1993-03-16 | Matsushita Electric Industrial Co., Ltd. | Compact reticle/wafer alignment system |
| JP2009533702A (ja) * | 2006-04-11 | 2009-09-17 | マイクロニック レーザー システムズ アクチボラゲット | 位置合わせ方法及びそのための装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0550128B2 (enrdf_load_stackoverflow) | 1993-07-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3374413B2 (ja) | 投影露光装置、投影露光方法、並びに集積回路製造方法 | |
| JP2606285B2 (ja) | 露光装置および位置合わせ方法 | |
| US4566795A (en) | Alignment apparatus | |
| US5777722A (en) | Scanning exposure apparatus and method | |
| JP2530587B2 (ja) | 位置決め装置 | |
| JPH03233925A (ja) | 自動焦点調整制御装置 | |
| JPS61174717A (ja) | 位置合わせ装置 | |
| JPH03212925A (ja) | 露光装置 | |
| JPH0122977B2 (enrdf_load_stackoverflow) | ||
| WO1985001834A1 (en) | Optical exposure apparatus | |
| JP2004342900A (ja) | 露光装置並びにレチクル形状測定装置及び方法 | |
| JPS60144937A (ja) | アライメントマ−クの検出装置 | |
| JPH11186129A (ja) | 走査型露光方法及び装置 | |
| JP3831720B2 (ja) | 多重干渉ビームを使用するレチクル焦点測定システムおよびレチクル焦点測定方法 | |
| JPS60160613A (ja) | 投影露光方法 | |
| US6317196B1 (en) | Projection exposure apparatus | |
| US4566796A (en) | Method of determining position on a wafer | |
| JPS5811803A (ja) | 膜厚測定方法およびその装置 | |
| JP2023077924A (ja) | 露光装置、露光方法、および物品製造方法 | |
| JPH0430175B2 (enrdf_load_stackoverflow) | ||
| JPS607483Y2 (ja) | 電子ビ−ム露光装置 | |
| JP3237022B2 (ja) | 投影露光装置 | |
| KR20240175295A (ko) | 노광 장치, 노광 방법 및 물품 제조 방법 | |
| JPH01292206A (ja) | 物体の表面状態測定装置及び表面の高さ測定装置 | |
| JPH06196387A (ja) | 基板の焦点合わせ方法および投影露光方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |