JPS5994433A - 半導体素子の選別装置 - Google Patents

半導体素子の選別装置

Info

Publication number
JPS5994433A
JPS5994433A JP57204008A JP20400882A JPS5994433A JP S5994433 A JPS5994433 A JP S5994433A JP 57204008 A JP57204008 A JP 57204008A JP 20400882 A JP20400882 A JP 20400882A JP S5994433 A JPS5994433 A JP S5994433A
Authority
JP
Japan
Prior art keywords
magazine
elements
magazines
cassette
empty
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57204008A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0249015B2 (enrdf_load_html_response
Inventor
Masaaki Yasunaga
安永　雅昭
Jiro Tsuchishima
土島　次郎
Eizo Wada
栄造 和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP57204008A priority Critical patent/JPS5994433A/ja
Publication of JPS5994433A publication Critical patent/JPS5994433A/ja
Publication of JPH0249015B2 publication Critical patent/JPH0249015B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supply And Installment Of Electrical Components (AREA)
JP57204008A 1982-11-19 1982-11-19 半導体素子の選別装置 Granted JPS5994433A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57204008A JPS5994433A (ja) 1982-11-19 1982-11-19 半導体素子の選別装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57204008A JPS5994433A (ja) 1982-11-19 1982-11-19 半導体素子の選別装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP3213938A Division JPH04355945A (ja) 1991-08-26 1991-08-26 半導体素子の選別方法

Publications (2)

Publication Number Publication Date
JPS5994433A true JPS5994433A (ja) 1984-05-31
JPH0249015B2 JPH0249015B2 (enrdf_load_html_response) 1990-10-26

Family

ID=16483238

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57204008A Granted JPS5994433A (ja) 1982-11-19 1982-11-19 半導体素子の選別装置

Country Status (1)

Country Link
JP (1) JPS5994433A (enrdf_load_html_response)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5984892U (ja) * 1982-11-29 1984-06-08 株式会社アドバンテスト Ｉｃ試験装置
JPS611097A (ja) * 1984-06-14 1986-01-07 日立電子エンジニアリング株式会社 マガジン自動供給装置
JPS6110572U (ja) * 1984-06-25 1986-01-22 株式会社アドバンテスト マガジンカセツト
JPS6153799A (ja) * 1984-08-23 1986-03-17 松下電器産業株式会社 部品供給装置
JPS6163094A (ja) * 1984-09-04 1986-04-01 松下電器産業株式会社 部品供給装置
JPS61178304A (ja) * 1985-01-31 1986-08-11 Nichiden Mach Ltd ワ−ク処理装置
JPS6274836A (ja) * 1985-09-30 1987-04-06 Toshiba Corp Ｉｃ試験用ハンドリング装置
JPS62261140A (ja) * 1986-05-07 1987-11-13 Nec Corp 半導体装置の電気的測定用のハンドリング装置
JPH01170864A (ja) * 1987-12-25 1989-07-05 Tokyo Electron Ltd テープキャリヤの検査装置
US4876305A (en) * 1987-12-14 1989-10-24 The B. F. Goodrich Company Oxidation resistant compositions for use with rare earth magnets
JPH01165700U (enrdf_load_html_response) * 1988-05-09 1989-11-20

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5984892U (ja) * 1982-11-29 1984-06-08 株式会社アドバンテスト Ｉｃ試験装置
JPS611097A (ja) * 1984-06-14 1986-01-07 日立電子エンジニアリング株式会社 マガジン自動供給装置
JPS6110572U (ja) * 1984-06-25 1986-01-22 株式会社アドバンテスト マガジンカセツト
JPS6153799A (ja) * 1984-08-23 1986-03-17 松下電器産業株式会社 部品供給装置
JPS6163094A (ja) * 1984-09-04 1986-04-01 松下電器産業株式会社 部品供給装置
JPS61178304A (ja) * 1985-01-31 1986-08-11 Nichiden Mach Ltd ワ−ク処理装置
JPS6274836A (ja) * 1985-09-30 1987-04-06 Toshiba Corp Ｉｃ試験用ハンドリング装置
JPS62261140A (ja) * 1986-05-07 1987-11-13 Nec Corp 半導体装置の電気的測定用のハンドリング装置
US4876305A (en) * 1987-12-14 1989-10-24 The B. F. Goodrich Company Oxidation resistant compositions for use with rare earth magnets
JPH01170864A (ja) * 1987-12-25 1989-07-05 Tokyo Electron Ltd テープキャリヤの検査装置
JPH01165700U (enrdf_load_html_response) * 1988-05-09 1989-11-20

Also Published As

Publication number Publication date
JPH0249015B2 (enrdf_load_html_response) 1990-10-26

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