JPS5932163A - Cmos集積回路 - Google Patents

Cmos集積回路

Info

Publication number
JPS5932163A
JPS5932163A JP57142847A JP14284782A JPS5932163A JP S5932163 A JPS5932163 A JP S5932163A JP 57142847 A JP57142847 A JP 57142847A JP 14284782 A JP14284782 A JP 14284782A JP S5932163 A JPS5932163 A JP S5932163A
Authority
JP
Japan
Prior art keywords
type
substrate
layer
region
well
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57142847A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6255309B2 (enExample
Inventor
Keimei Mikoshiba
御子柴 啓明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP57142847A priority Critical patent/JPS5932163A/ja
Publication of JPS5932163A publication Critical patent/JPS5932163A/ja
Publication of JPS6255309B2 publication Critical patent/JPS6255309B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/85Complementary IGFETs, e.g. CMOS
    • H10D84/854Complementary IGFETs, e.g. CMOS comprising arrangements for preventing bipolar actions between the different IGFET regions, e.g. arrangements for latchup prevention

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
JP57142847A 1982-08-18 1982-08-18 Cmos集積回路 Granted JPS5932163A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57142847A JPS5932163A (ja) 1982-08-18 1982-08-18 Cmos集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57142847A JPS5932163A (ja) 1982-08-18 1982-08-18 Cmos集積回路

Publications (2)

Publication Number Publication Date
JPS5932163A true JPS5932163A (ja) 1984-02-21
JPS6255309B2 JPS6255309B2 (enExample) 1987-11-19

Family

ID=15324991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57142847A Granted JPS5932163A (ja) 1982-08-18 1982-08-18 Cmos集積回路

Country Status (1)

Country Link
JP (1) JPS5932163A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60260144A (ja) * 1984-06-06 1985-12-23 Sony Corp 半導体装置
US4683488A (en) * 1984-03-29 1987-07-28 Hughes Aircraft Company Latch-up resistant CMOS structure for VLSI including retrograded wells
JPH01101662A (ja) * 1987-09-18 1989-04-19 Sgs Thomson Microelectron Inc Cmos集積回路デバイスの製造方法
JPH0298168A (ja) * 1988-10-04 1990-04-10 Nec Corp 半導体装置
EP0827205A3 (en) * 1996-08-29 1998-09-23 Sharp Kabushiki Kaisha Method for manufacturing a semiconductor device
KR100415085B1 (ko) * 2001-06-28 2004-01-13 주식회사 하이닉스반도체 래치업을 방지할 수 있는 반도체장치의 제조방법
JP2012253276A (ja) * 2011-06-06 2012-12-20 Renesas Electronics Corp 半導体装置、半導体装置の製造方法、電子装置、及び車両

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5237755A (en) * 1974-11-18 1977-03-23 Ampex Frequency modulator
JPS5480091A (en) * 1977-12-08 1979-06-26 Nec Corp Manufacture of complementary field effect semiconductor device
JPS55154748A (en) * 1979-05-23 1980-12-02 Toshiba Corp Complementary mos semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5237755A (en) * 1974-11-18 1977-03-23 Ampex Frequency modulator
JPS5480091A (en) * 1977-12-08 1979-06-26 Nec Corp Manufacture of complementary field effect semiconductor device
JPS55154748A (en) * 1979-05-23 1980-12-02 Toshiba Corp Complementary mos semiconductor device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4683488A (en) * 1984-03-29 1987-07-28 Hughes Aircraft Company Latch-up resistant CMOS structure for VLSI including retrograded wells
JPS60260144A (ja) * 1984-06-06 1985-12-23 Sony Corp 半導体装置
JPH01101662A (ja) * 1987-09-18 1989-04-19 Sgs Thomson Microelectron Inc Cmos集積回路デバイスの製造方法
JPH0298168A (ja) * 1988-10-04 1990-04-10 Nec Corp 半導体装置
EP0827205A3 (en) * 1996-08-29 1998-09-23 Sharp Kabushiki Kaisha Method for manufacturing a semiconductor device
KR100415085B1 (ko) * 2001-06-28 2004-01-13 주식회사 하이닉스반도체 래치업을 방지할 수 있는 반도체장치의 제조방법
JP2012253276A (ja) * 2011-06-06 2012-12-20 Renesas Electronics Corp 半導体装置、半導体装置の製造方法、電子装置、及び車両
US9082835B2 (en) 2011-06-06 2015-07-14 Renesas Electronics Corporation Semiconductor device, manufacturing method thereof, electronic device and vehicle
US9362396B2 (en) 2011-06-06 2016-06-07 Renesas Electronics Corporation Semiconductor device, manufacturing method thereof, electronic device and vehicle
TWI548091B (zh) * 2011-06-06 2016-09-01 瑞薩電子股份有限公司 半導體裝置、半導體裝置之製造方法、電子裝置及車輛

Also Published As

Publication number Publication date
JPS6255309B2 (enExample) 1987-11-19

Similar Documents

Publication Publication Date Title
US7687853B2 (en) System and method for making a LDMOS device with electrostatic discharge protection
US5185535A (en) Control of backgate bias for low power high speed CMOS/SOI devices
EP1543546B1 (en) Process for fabricating an isolated field effect transistor in an epi-less substrate
KR950006479B1 (ko) 래터럴 트랜지스터
US20030127689A1 (en) High voltage MOS transistor with up-retro well
US7268394B2 (en) JFET structure for integrated circuit and fabrication method
US6261932B1 (en) Method of fabricating Schottky diode and related structure
JPH01155653A (ja) 高電圧併合バイポーラ/cmos集積回路
US6600205B2 (en) Method for making low voltage transistors with increased breakdown voltage to substrate having three different MOS transistors
US20020117714A1 (en) High voltage MOS transistor
JPS6050960A (ja) 半導体装置
US6987039B2 (en) Forming lateral bipolar junction transistor in CMOS flow
US11626325B2 (en) Method of making a silicon carbide integrated circuit
US7667295B2 (en) Semiconductor device
JPH04239760A (ja) 半導体装置の製造法
US10224402B2 (en) Method of improving lateral BJT characteristics in BCD technology
JPS5932163A (ja) Cmos集積回路
KR0139773B1 (ko) 반도체 집적 회로 장치 및 그 제조 방법
KR100922557B1 (ko) Cmos 트랜지스터 및 그 제조 방법
JP4304779B2 (ja) 半導体装置およびその製造方法
US6337252B1 (en) Semiconductor device manufacturing method
JP2508218B2 (ja) 相補型mis集積回路
JP2953915B2 (ja) 半導体集積回路装置及びその製造方法
JPH0296364A (ja) 半導体装置およびその製造方法
JP2004273551A (ja) 半導体集積回路装置およびその製造方法