JPS59231654A - 半導体集積回路装置とその検査方法 - Google Patents
半導体集積回路装置とその検査方法Info
- Publication number
- JPS59231654A JPS59231654A JP58105823A JP10582383A JPS59231654A JP S59231654 A JPS59231654 A JP S59231654A JP 58105823 A JP58105823 A JP 58105823A JP 10582383 A JP10582383 A JP 10582383A JP S59231654 A JPS59231654 A JP S59231654A
- Authority
- JP
- Japan
- Prior art keywords
- program
- integrated circuit
- semiconductor integrated
- circuit device
- outside
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/78—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure storage of data
- G06F21/79—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure storage of data in semiconductor storage media, e.g. directly-addressable memories
Landscapes
- Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58105823A JPS59231654A (ja) | 1983-06-15 | 1983-06-15 | 半導体集積回路装置とその検査方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58105823A JPS59231654A (ja) | 1983-06-15 | 1983-06-15 | 半導体集積回路装置とその検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59231654A true JPS59231654A (ja) | 1984-12-26 |
JPH0554139B2 JPH0554139B2 (enrdf_load_stackoverflow) | 1993-08-11 |
Family
ID=14417779
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58105823A Granted JPS59231654A (ja) | 1983-06-15 | 1983-06-15 | 半導体集積回路装置とその検査方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59231654A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6276756A (ja) * | 1985-09-30 | 1987-04-08 | Toshiba Corp | 自己検査回路を備えた半導体装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5617446A (en) * | 1979-07-20 | 1981-02-19 | Oki Electric Ind Co Ltd | Microcomputer |
JPS5851369A (ja) * | 1981-09-24 | 1983-03-26 | Nec Corp | テスト回路つきマイクロコンピユ−タ |
-
1983
- 1983-06-15 JP JP58105823A patent/JPS59231654A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5617446A (en) * | 1979-07-20 | 1981-02-19 | Oki Electric Ind Co Ltd | Microcomputer |
JPS5851369A (ja) * | 1981-09-24 | 1983-03-26 | Nec Corp | テスト回路つきマイクロコンピユ−タ |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6276756A (ja) * | 1985-09-30 | 1987-04-08 | Toshiba Corp | 自己検査回路を備えた半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0554139B2 (enrdf_load_stackoverflow) | 1993-08-11 |
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