JPS59137855A - 質量分析装置 - Google Patents

質量分析装置

Info

Publication number
JPS59137855A
JPS59137855A JP58012342A JP1234283A JPS59137855A JP S59137855 A JPS59137855 A JP S59137855A JP 58012342 A JP58012342 A JP 58012342A JP 1234283 A JP1234283 A JP 1234283A JP S59137855 A JPS59137855 A JP S59137855A
Authority
JP
Japan
Prior art keywords
magnetic field
sweep
electric field
detector
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58012342A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0319947B2 (cg-RX-API-DMAC7.html
Inventor
Hirosuke Maruyama
丸山　裕助
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
NTT Inc
Original Assignee
Jeol Ltd
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP58012342A priority Critical patent/JPS59137855A/ja
Publication of JPS59137855A publication Critical patent/JPS59137855A/ja
Publication of JPH0319947B2 publication Critical patent/JPH0319947B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP58012342A 1983-01-28 1983-01-28 質量分析装置 Granted JPS59137855A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58012342A JPS59137855A (ja) 1983-01-28 1983-01-28 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58012342A JPS59137855A (ja) 1983-01-28 1983-01-28 質量分析装置

Publications (2)

Publication Number Publication Date
JPS59137855A true JPS59137855A (ja) 1984-08-08
JPH0319947B2 JPH0319947B2 (cg-RX-API-DMAC7.html) 1991-03-18

Family

ID=11802606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58012342A Granted JPS59137855A (ja) 1983-01-28 1983-01-28 質量分析装置

Country Status (1)

Country Link
JP (1) JPS59137855A (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63259955A (ja) * 1987-04-15 1988-10-27 Jeol Ltd ウイ−ンフイルタを用いた二重収束質量分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56128558A (en) * 1980-03-12 1981-10-08 Hitachi Ltd Double focusing mass spectrograph

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56128558A (en) * 1980-03-12 1981-10-08 Hitachi Ltd Double focusing mass spectrograph

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63259955A (ja) * 1987-04-15 1988-10-27 Jeol Ltd ウイ−ンフイルタを用いた二重収束質量分析装置

Also Published As

Publication number Publication date
JPH0319947B2 (cg-RX-API-DMAC7.html) 1991-03-18

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