JPS59131181A - 論理回路部の診断方法 - Google Patents

論理回路部の診断方法

Info

Publication number
JPS59131181A
JPS59131181A JP58004880A JP488083A JPS59131181A JP S59131181 A JPS59131181 A JP S59131181A JP 58004880 A JP58004880 A JP 58004880A JP 488083 A JP488083 A JP 488083A JP S59131181 A JPS59131181 A JP S59131181A
Authority
JP
Japan
Prior art keywords
memory
line
address
logic circuit
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58004880A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0568665B2 (enrdf_load_html_response
Inventor
Kazuhisa Genma
和寿 源馬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58004880A priority Critical patent/JPS59131181A/ja
Publication of JPS59131181A publication Critical patent/JPS59131181A/ja
Publication of JPH0568665B2 publication Critical patent/JPH0568665B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58004880A 1983-01-14 1983-01-14 論理回路部の診断方法 Granted JPS59131181A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58004880A JPS59131181A (ja) 1983-01-14 1983-01-14 論理回路部の診断方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58004880A JPS59131181A (ja) 1983-01-14 1983-01-14 論理回路部の診断方法

Publications (2)

Publication Number Publication Date
JPS59131181A true JPS59131181A (ja) 1984-07-27
JPH0568665B2 JPH0568665B2 (enrdf_load_html_response) 1993-09-29

Family

ID=11595985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58004880A Granted JPS59131181A (ja) 1983-01-14 1983-01-14 論理回路部の診断方法

Country Status (1)

Country Link
JP (1) JPS59131181A (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPH0568665B2 (enrdf_load_html_response) 1993-09-29

Similar Documents

Publication Publication Date Title
EP0189638A1 (en) Bus width adapter
JPS636887B2 (enrdf_load_html_response)
KR900002438B1 (ko) 프로세서간 결합방식
JPS59131181A (ja) 論理回路部の診断方法
JPH0672911B2 (ja) システムｌｓｉ
US4876645A (en) Diagnostic system
US4766593A (en) Monolithically integrated testable registers that cannot be directly addressed
JPS6159697A (ja) ゲ−トアレイ
JPS583256A (ja) Ｌｓｉチツプ
EP0087314B1 (en) Diagnostic system in a data processor
JPS60749A (ja) 回路素子の品種名識別方法
JPS6167147A (ja) 集積回路のスキヤンイン・スキヤンアウト方式
JPS61198336A (ja) スキヤン・イン制御方式
JPH04313891A (ja) Ｉｃカード
JPS6032213B2 (ja) 論理装置の診断方式
KR870003281Y1 (ko) 인터페이스회로
JPH06195477A (ja) Ｃｐｕ組込みｌｓｉ
JPH0690264B2 (ja) 集積回路
JPS5812192A (ja) 半導体集積回路装置
JPS6010349A (ja) スキヤン方式
JPS6232513B2 (enrdf_load_html_response)
JPH0561708A (ja) 半導体集積装置
JPH07120535A (ja) 論理回路の診断方法およびｌｓｉ回路
JPS59218548A (ja) 論理回路
JPH06118133A (ja) Ｌｓｉのテスト方法