JPS59119843A - 自動ワイヤ検査装置 - Google Patents

自動ワイヤ検査装置

Info

Publication number
JPS59119843A
JPS59119843A JP57228408A JP22840882A JPS59119843A JP S59119843 A JPS59119843 A JP S59119843A JP 57228408 A JP57228408 A JP 57228408A JP 22840882 A JP22840882 A JP 22840882A JP S59119843 A JPS59119843 A JP S59119843A
Authority
JP
Japan
Prior art keywords
wire
circuit
calcurated
deltay
deltax
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57228408A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0524667B2 (cg-RX-API-DMAC10.html
Inventor
Hiroyuki Tsukahara
博之 塚原
Masahito Nakajima
雅人 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57228408A priority Critical patent/JPS59119843A/ja
Publication of JPS59119843A publication Critical patent/JPS59119843A/ja
Publication of JPH0524667B2 publication Critical patent/JPH0524667B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10W72/075—
    • H10W72/07531—
    • H10W72/07551—
    • H10W72/50—
    • H10W72/536—
    • H10W72/5363—
    • H10W72/5449—
    • H10W72/932—
    • H10W90/756—

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Wire Bonding (AREA)
JP57228408A 1982-12-27 1982-12-27 自動ワイヤ検査装置 Granted JPS59119843A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57228408A JPS59119843A (ja) 1982-12-27 1982-12-27 自動ワイヤ検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57228408A JPS59119843A (ja) 1982-12-27 1982-12-27 自動ワイヤ検査装置

Publications (2)

Publication Number Publication Date
JPS59119843A true JPS59119843A (ja) 1984-07-11
JPH0524667B2 JPH0524667B2 (cg-RX-API-DMAC10.html) 1993-04-08

Family

ID=16875996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57228408A Granted JPS59119843A (ja) 1982-12-27 1982-12-27 自動ワイヤ検査装置

Country Status (1)

Country Link
JP (1) JPS59119843A (cg-RX-API-DMAC10.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03229439A (ja) * 1990-02-05 1991-10-11 Marine Instr Co Ltd ワイヤリング検査可能なワイヤボンディング装置及びその方法並びにワイヤリング自動検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57155743A (en) * 1981-03-20 1982-09-25 Fujitsu Ltd Inspection device for semiconductor bonding wire

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57155743A (en) * 1981-03-20 1982-09-25 Fujitsu Ltd Inspection device for semiconductor bonding wire

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03229439A (ja) * 1990-02-05 1991-10-11 Marine Instr Co Ltd ワイヤリング検査可能なワイヤボンディング装置及びその方法並びにワイヤリング自動検査装置

Also Published As

Publication number Publication date
JPH0524667B2 (cg-RX-API-DMAC10.html) 1993-04-08

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