JPS5885178A - Ｉｃテスト方式 - Google Patents

Ｉｃテスト方式

Info

Publication number
JPS5885178A
JPS5885178A JP56183106A JP18310681A JPS5885178A JP S5885178 A JPS5885178 A JP S5885178A JP 56183106 A JP56183106 A JP 56183106A JP 18310681 A JP18310681 A JP 18310681A JP S5885178 A JPS5885178 A JP S5885178A
Authority
JP
Japan
Prior art keywords
output
test
pattern
flop
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56183106A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0226748B2 (enExample
Inventor
Shigeo Kamiya
神谷　茂雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56183106A priority Critical patent/JPS5885178A/ja
Publication of JPS5885178A publication Critical patent/JPS5885178A/ja
Publication of JPH0226748B2 publication Critical patent/JPH0226748B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56183106A 1981-11-17 1981-11-17 Ｉｃテスト方式 Granted JPS5885178A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56183106A JPS5885178A (ja) 1981-11-17 1981-11-17 Ｉｃテスト方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56183106A JPS5885178A (ja) 1981-11-17 1981-11-17 Ｉｃテスト方式

Publications (2)

Publication Number Publication Date
JPS5885178A true JPS5885178A (ja) 1983-05-21
JPH0226748B2 JPH0226748B2 (enExample) 1990-06-12

Family

ID=16129872

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56183106A Granted JPS5885178A (ja) 1981-11-17 1981-11-17 Ｉｃテスト方式

Country Status (1)

Country Link
JP (1) JPS5885178A (enExample)

Also Published As

Publication number Publication date
JPH0226748B2 (enExample) 1990-06-12

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