JPS5873136A - 半導体デバイスの製造方法 - Google Patents

半導体デバイスの製造方法

Info

Publication number
JPS5873136A
JPS5873136A JP57177460A JP17746082A JPS5873136A JP S5873136 A JPS5873136 A JP S5873136A JP 57177460 A JP57177460 A JP 57177460A JP 17746082 A JP17746082 A JP 17746082A JP S5873136 A JPS5873136 A JP S5873136A
Authority
JP
Japan
Prior art keywords
metallization
metallization process
metallized
substrate
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57177460A
Other languages
English (en)
Japanese (ja)
Inventor
ヘルマン・キンツエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Siemens AG
Original Assignee
Siemens Schuckertwerke AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Schuckertwerke AG, Siemens AG filed Critical Siemens Schuckertwerke AG
Publication of JPS5873136A publication Critical patent/JPS5873136A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/32051Deposition of metallic or metal-silicide layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76877Filling of holes, grooves or trenches, e.g. vias, with conductive material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • H01L21/76886Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Weting (AREA)
  • Electrodes Of Semiconductors (AREA)
JP57177460A 1981-10-13 1982-10-08 半導体デバイスの製造方法 Pending JPS5873136A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE313406696 1981-10-13
DE19813140669 DE3140669A1 (de) 1981-10-13 1981-10-13 Verfahren zum herstellen von halbleitervorrichtungen

Publications (1)

Publication Number Publication Date
JPS5873136A true JPS5873136A (ja) 1983-05-02

Family

ID=6144015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57177460A Pending JPS5873136A (ja) 1981-10-13 1982-10-08 半導体デバイスの製造方法

Country Status (3)

Country Link
EP (1) EP0079459B1 (de)
JP (1) JPS5873136A (de)
DE (2) DE3140669A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0611076B2 (ja) * 1985-10-08 1994-02-09 三菱電機株式会社 半導体装置の製造方法
EP0225224A3 (de) * 1985-10-29 1987-11-19 Thomson Components-Mostek Corporation Ablagerung von Oxid nach einem Metallegierungsverfahren
JPS63160328A (ja) * 1986-12-24 1988-07-04 Mitsubishi Electric Corp 半導体装置の製造方法
EP0533254A3 (en) * 1991-09-19 1993-06-23 N.V. Philips' Gloeilampenfabrieken Method of manufacturing a semiconductor device whereby a layer comprising aluminium is deposited on a surface for a semiconductor body

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4017890A (en) * 1975-10-24 1977-04-12 International Business Machines Corporation Intermetallic compound layer in thin films for improved electromigration resistance
JPS5334484A (en) * 1976-09-10 1978-03-31 Toshiba Corp Forming method for multi layer wiring
JPS56105654A (en) * 1980-01-28 1981-08-22 Mitsubishi Electric Corp Semiconductor device

Also Published As

Publication number Publication date
EP0079459B1 (de) 1986-05-07
EP0079459A2 (de) 1983-05-25
DE3271028D1 (en) 1986-06-12
DE3140669A1 (de) 1983-04-28
EP0079459A3 (en) 1984-06-06

Similar Documents

Publication Publication Date Title
US4337476A (en) Silicon rich refractory silicides as gate metal
JPS61142739A (ja) 半導体装置の製造方法
JPH04229618A (ja) 集積回路デバイスの接点及びその形成方法
JPS5873136A (ja) 半導体デバイスの製造方法
JPS62113421A (ja) 半導体装置の製造方法
JPS6364057B2 (de)
JPS5910271A (ja) 半導体装置
JPH0258259A (ja) 半導体装置の製造方法
JPS6262056B2 (de)
JPS6394673A (ja) シヨツトキバリア半導体装置の製造方法
JPH01166556A (ja) n型GaAsオーム性電極およびその形成方法
JPH01253257A (ja) 半導体集積デバイス
JP2917872B2 (ja) 半導体装置の製造方法
JPS60186038A (ja) 半導体装置
JPH06252347A (ja) Mimキャパシタ及びその製造方法
JPH01270333A (ja) 半導体装置の製造方法
KR100222124B1 (ko) 반도체 소자의 금속 배선 형성방법
KR950005265B1 (ko) 금속배선층 형성방법
JPH03169018A (ja) 半導体集積回路の製造方法
JPS59189657A (ja) 半導体装置の製造方法
JPS6297348A (ja) 半導体装置の製造方法
JPH0224021B2 (de)
JPH0391240A (ja) 金属電極配線の製造方法
JPH01200651A (ja) 半導体装置の製造方法
JPS62193280A (ja) シヨツトキ−バリアダイオ−ド