JPS5854749A - 通信回線切替動作試験装置 - Google Patents

通信回線切替動作試験装置

Info

Publication number
JPS5854749A
JPS5854749A JP56152907A JP15290781A JPS5854749A JP S5854749 A JPS5854749 A JP S5854749A JP 56152907 A JP56152907 A JP 56152907A JP 15290781 A JP15290781 A JP 15290781A JP S5854749 A JPS5854749 A JP S5854749A
Authority
JP
Japan
Prior art keywords
mode
memory
test
section
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56152907A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6233777B2 (cs
Inventor
Masaaki Kurata
倉田 正明
Shigeru Nakamura
成 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56152907A priority Critical patent/JPS5854749A/ja
Publication of JPS5854749A publication Critical patent/JPS5854749A/ja
Publication of JPS6233777B2 publication Critical patent/JPS6233777B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B1/00Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/74Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission for increasing reliability, e.g. using redundant or spare channels or apparatus

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
JP56152907A 1981-09-29 1981-09-29 通信回線切替動作試験装置 Granted JPS5854749A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56152907A JPS5854749A (ja) 1981-09-29 1981-09-29 通信回線切替動作試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56152907A JPS5854749A (ja) 1981-09-29 1981-09-29 通信回線切替動作試験装置

Publications (2)

Publication Number Publication Date
JPS5854749A true JPS5854749A (ja) 1983-03-31
JPS6233777B2 JPS6233777B2 (cs) 1987-07-22

Family

ID=15550740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56152907A Granted JPS5854749A (ja) 1981-09-29 1981-09-29 通信回線切替動作試験装置

Country Status (1)

Country Link
JP (1) JPS5854749A (cs)

Also Published As

Publication number Publication date
JPS6233777B2 (cs) 1987-07-22

Similar Documents

Publication Publication Date Title
EP0068108B1 (en) System and process for diagnosing and correcting errors in a remote data processing equipment
US5423029A (en) Circuit and method for testing direct memory access circuitry
JPH04211944A (ja) 印刷機の電子制御装置の診断装置および方法
JPS5854749A (ja) 通信回線切替動作試験装置
KR100818837B1 (ko) 피씨아이 브리지를 이용한 이중화장치
JP2637653B2 (ja) 冗長化制御装置
JPS6011953A (ja) メモリ装置
JP3348251B2 (ja) 入出力装置
JPH08278924A (ja) アダプタ診断システム
JP2765659B2 (ja) データ処理装置の自己テスト方式
JP2976897B2 (ja) 伝送装置におけるデータバックアップ方式
JP3284623B2 (ja) 装置作動用プログラムの変更装置
JP2877505B2 (ja) Lsi実装ボード及びデータ処理装置
JP2670645B2 (ja) 入出力装置
KR100260082B1 (ko) 교환기에서 과금 서비스 기록 방법
JPH05211000A (ja) メモリテスト装置
JPS60136838A (ja) 情報記録装置
JPS6167164A (ja) 入出力チヤネルのハ−ドウエア診断方式
JPH08115237A (ja) プリンタ診断システム
KR20030063689A (ko) 프로세서의 외부 메모리 억세스 장치
JPH0743655B2 (ja) 情報処理装置
JPH01218154A (ja) 通話路試験方式
JPS6389938A (ja) シフトパス故障診断方式
JPS62212583A (ja) テストシステム自己診断装置
KR19990002992A (ko) 하드웨어 로직을 이용한 디스플레이 모듈 시험장치