JPS5851452A - 分析電子顕微鏡 - Google Patents
分析電子顕微鏡Info
- Publication number
- JPS5851452A JPS5851452A JP56148021A JP14802181A JPS5851452A JP S5851452 A JPS5851452 A JP S5851452A JP 56148021 A JP56148021 A JP 56148021A JP 14802181 A JP14802181 A JP 14802181A JP S5851452 A JPS5851452 A JP S5851452A
- Authority
- JP
- Japan
- Prior art keywords
- energy
- electron beam
- sample
- analyzer
- electrons
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56148021A JPS5851452A (ja) | 1981-09-19 | 1981-09-19 | 分析電子顕微鏡 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56148021A JPS5851452A (ja) | 1981-09-19 | 1981-09-19 | 分析電子顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5851452A true JPS5851452A (ja) | 1983-03-26 |
| JPS6332220B2 JPS6332220B2 (enrdf_load_stackoverflow) | 1988-06-29 |
Family
ID=15443327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56148021A Granted JPS5851452A (ja) | 1981-09-19 | 1981-09-19 | 分析電子顕微鏡 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5851452A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004165146A (ja) * | 2002-08-02 | 2004-06-10 | Leo Elektronenmikroskopie Gmbh | 電子顕微鏡システム |
| EP1463089A3 (en) * | 2003-03-24 | 2009-07-29 | Hitachi High-Technologies Corporation | Electron microscope with an energy filter |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5227349A (en) * | 1975-08-28 | 1977-03-01 | Siemens Ag | Transmission scanning particle beam microscope |
-
1981
- 1981-09-19 JP JP56148021A patent/JPS5851452A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5227349A (en) * | 1975-08-28 | 1977-03-01 | Siemens Ag | Transmission scanning particle beam microscope |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004165146A (ja) * | 2002-08-02 | 2004-06-10 | Leo Elektronenmikroskopie Gmbh | 電子顕微鏡システム |
| EP1463089A3 (en) * | 2003-03-24 | 2009-07-29 | Hitachi High-Technologies Corporation | Electron microscope with an energy filter |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6332220B2 (enrdf_load_stackoverflow) | 1988-06-29 |
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