JPS5838845A - 彎曲結晶型x線分光器 - Google Patents
彎曲結晶型x線分光器Info
- Publication number
- JPS5838845A JPS5838845A JP56137387A JP13738781A JPS5838845A JP S5838845 A JPS5838845 A JP S5838845A JP 56137387 A JP56137387 A JP 56137387A JP 13738781 A JP13738781 A JP 13738781A JP S5838845 A JPS5838845 A JP S5838845A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- ray
- slit
- spectroscopic
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56137387A JPS5838845A (ja) | 1981-08-31 | 1981-08-31 | 彎曲結晶型x線分光器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56137387A JPS5838845A (ja) | 1981-08-31 | 1981-08-31 | 彎曲結晶型x線分光器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5838845A true JPS5838845A (ja) | 1983-03-07 |
| JPH0132940B2 JPH0132940B2 (enrdf_load_stackoverflow) | 1989-07-11 |
Family
ID=15197492
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56137387A Granted JPS5838845A (ja) | 1981-08-31 | 1981-08-31 | 彎曲結晶型x線分光器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5838845A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01118398U (enrdf_load_stackoverflow) * | 1988-01-30 | 1989-08-10 | ||
| JPH01214747A (ja) * | 1988-02-24 | 1989-08-29 | Mc Sci:Kk | X線回折装置 |
| US7646848B2 (en) | 2004-11-29 | 2010-01-12 | Stresstech Oy | Goniometer |
-
1981
- 1981-08-31 JP JP56137387A patent/JPS5838845A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01118398U (enrdf_load_stackoverflow) * | 1988-01-30 | 1989-08-10 | ||
| JPH01214747A (ja) * | 1988-02-24 | 1989-08-29 | Mc Sci:Kk | X線回折装置 |
| US7646848B2 (en) | 2004-11-29 | 2010-01-12 | Stresstech Oy | Goniometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0132940B2 (enrdf_load_stackoverflow) | 1989-07-11 |
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