JPS5838845A - 彎曲結晶型x線分光器 - Google Patents

彎曲結晶型x線分光器

Info

Publication number
JPS5838845A
JPS5838845A JP56137387A JP13738781A JPS5838845A JP S5838845 A JPS5838845 A JP S5838845A JP 56137387 A JP56137387 A JP 56137387A JP 13738781 A JP13738781 A JP 13738781A JP S5838845 A JPS5838845 A JP S5838845A
Authority
JP
Japan
Prior art keywords
crystal
ray
slit
spectroscopic
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56137387A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0132940B2 (enrdf_load_stackoverflow
Inventor
Ryoichi Shimizu
良一 清水
Hidenobu Ishida
石田 秀信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP56137387A priority Critical patent/JPS5838845A/ja
Publication of JPS5838845A publication Critical patent/JPS5838845A/ja
Publication of JPH0132940B2 publication Critical patent/JPH0132940B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
JP56137387A 1981-08-31 1981-08-31 彎曲結晶型x線分光器 Granted JPS5838845A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56137387A JPS5838845A (ja) 1981-08-31 1981-08-31 彎曲結晶型x線分光器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56137387A JPS5838845A (ja) 1981-08-31 1981-08-31 彎曲結晶型x線分光器

Publications (2)

Publication Number Publication Date
JPS5838845A true JPS5838845A (ja) 1983-03-07
JPH0132940B2 JPH0132940B2 (enrdf_load_stackoverflow) 1989-07-11

Family

ID=15197492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56137387A Granted JPS5838845A (ja) 1981-08-31 1981-08-31 彎曲結晶型x線分光器

Country Status (1)

Country Link
JP (1) JPS5838845A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01118398U (enrdf_load_stackoverflow) * 1988-01-30 1989-08-10
JPH01214747A (ja) * 1988-02-24 1989-08-29 Mc Sci:Kk X線回折装置
US7646848B2 (en) 2004-11-29 2010-01-12 Stresstech Oy Goniometer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01118398U (enrdf_load_stackoverflow) * 1988-01-30 1989-08-10
JPH01214747A (ja) * 1988-02-24 1989-08-29 Mc Sci:Kk X線回折装置
US7646848B2 (en) 2004-11-29 2010-01-12 Stresstech Oy Goniometer

Also Published As

Publication number Publication date
JPH0132940B2 (enrdf_load_stackoverflow) 1989-07-11

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