JPS5832146A - ドロップアウト評価装置 - Google Patents

ドロップアウト評価装置

Info

Publication number
JPS5832146A
JPS5832146A JP56131125A JP13112581A JPS5832146A JP S5832146 A JPS5832146 A JP S5832146A JP 56131125 A JP56131125 A JP 56131125A JP 13112581 A JP13112581 A JP 13112581A JP S5832146 A JPS5832146 A JP S5832146A
Authority
JP
Japan
Prior art keywords
circuit
signal
dropout
output
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56131125A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6359458B2 (online.php
Inventor
Yasushi Toufuku
遠富　康
Yasuo Ono
大野　保雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56131125A priority Critical patent/JPS5832146A/ja
Publication of JPS5832146A publication Critical patent/JPS5832146A/ja
Publication of JPS6359458B2 publication Critical patent/JPS6359458B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Television Signal Processing For Recording (AREA)
JP56131125A 1981-08-20 1981-08-20 ドロップアウト評価装置 Granted JPS5832146A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56131125A JPS5832146A (ja) 1981-08-20 1981-08-20 ドロップアウト評価装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56131125A JPS5832146A (ja) 1981-08-20 1981-08-20 ドロップアウト評価装置

Publications (2)

Publication Number Publication Date
JPS5832146A true JPS5832146A (ja) 1983-02-25
JPS6359458B2 JPS6359458B2 (online.php) 1988-11-18

Family

ID=15050564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56131125A Granted JPS5832146A (ja) 1981-08-20 1981-08-20 ドロップアウト評価装置

Country Status (1)

Country Link
JP (1) JPS5832146A (online.php)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59215040A (ja) * 1983-05-20 1984-12-04 Toshiba Corp 画像情報円盤欠陥検出装置
JPS6045958A (ja) * 1983-08-22 1985-03-12 Victor Co Of Japan Ltd ドロツプアウト発生角度検出回路
JPS60117432A (ja) * 1983-11-17 1985-06-24 ポリグラム・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング 光学読み取り可能な高記録密度のディスク状情報担体の製造時の製造エラーを検出する装置
JPS6154473A (ja) * 1984-08-27 1986-03-18 Sony Tektronix Corp 磁気デイスク特性表示方法
JPS61204845A (ja) * 1985-03-06 1986-09-10 Sanyo Electric Co Ltd 光学読取装置
JPS6472087A (en) * 1987-08-11 1989-03-16 Du Pont Determination of position of drop out for magnetic disc and inspection thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59215040A (ja) * 1983-05-20 1984-12-04 Toshiba Corp 画像情報円盤欠陥検出装置
JPS6045958A (ja) * 1983-08-22 1985-03-12 Victor Co Of Japan Ltd ドロツプアウト発生角度検出回路
JPS60117432A (ja) * 1983-11-17 1985-06-24 ポリグラム・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング 光学読み取り可能な高記録密度のディスク状情報担体の製造時の製造エラーを検出する装置
JPS6154473A (ja) * 1984-08-27 1986-03-18 Sony Tektronix Corp 磁気デイスク特性表示方法
JPS61204845A (ja) * 1985-03-06 1986-09-10 Sanyo Electric Co Ltd 光学読取装置
JPS6472087A (en) * 1987-08-11 1989-03-16 Du Pont Determination of position of drop out for magnetic disc and inspection thereof

Also Published As

Publication number Publication date
JPS6359458B2 (online.php) 1988-11-18

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