JPS5824871A - 半導体パッケ−ジ測定治具 - Google Patents
半導体パッケ−ジ測定治具Info
- Publication number
- JPS5824871A JPS5824871A JP56123421A JP12342181A JPS5824871A JP S5824871 A JPS5824871 A JP S5824871A JP 56123421 A JP56123421 A JP 56123421A JP 12342181 A JP12342181 A JP 12342181A JP S5824871 A JPS5824871 A JP S5824871A
- Authority
- JP
- Japan
- Prior art keywords
- package
- resin plate
- contact
- section
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56123421A JPS5824871A (ja) | 1981-08-06 | 1981-08-06 | 半導体パッケ−ジ測定治具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56123421A JPS5824871A (ja) | 1981-08-06 | 1981-08-06 | 半導体パッケ−ジ測定治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5824871A true JPS5824871A (ja) | 1983-02-14 |
JPH0427507B2 JPH0427507B2 (pt) | 1992-05-12 |
Family
ID=14860131
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56123421A Granted JPS5824871A (ja) | 1981-08-06 | 1981-08-06 | 半導体パッケ−ジ測定治具 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5824871A (pt) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6258780U (pt) * | 1985-09-30 | 1987-04-11 | ||
JPS6258778U (pt) * | 1985-09-30 | 1987-04-11 | ||
JPS6258779U (pt) * | 1985-09-30 | 1987-04-11 | ||
JPH0310273U (pt) * | 1989-06-15 | 1991-01-31 | ||
JPH05209933A (ja) * | 1992-01-29 | 1993-08-20 | Nec Corp | 被測定物位置出し機構付きコンタクタおよびそれを用いた自動選別装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54119667U (pt) * | 1978-02-10 | 1979-08-22 |
-
1981
- 1981-08-06 JP JP56123421A patent/JPS5824871A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54119667U (pt) * | 1978-02-10 | 1979-08-22 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6258780U (pt) * | 1985-09-30 | 1987-04-11 | ||
JPS6258778U (pt) * | 1985-09-30 | 1987-04-11 | ||
JPS6258779U (pt) * | 1985-09-30 | 1987-04-11 | ||
JPH0310273U (pt) * | 1989-06-15 | 1991-01-31 | ||
JPH05209933A (ja) * | 1992-01-29 | 1993-08-20 | Nec Corp | 被測定物位置出し機構付きコンタクタおよびそれを用いた自動選別装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0427507B2 (pt) | 1992-05-12 |
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