JPS58225418A - 入出力装置の診断制御方式 - Google Patents

入出力装置の診断制御方式

Info

Publication number
JPS58225418A
JPS58225418A JP57109017A JP10901782A JPS58225418A JP S58225418 A JPS58225418 A JP S58225418A JP 57109017 A JP57109017 A JP 57109017A JP 10901782 A JP10901782 A JP 10901782A JP S58225418 A JPS58225418 A JP S58225418A
Authority
JP
Japan
Prior art keywords
self
diagnosis
routine
microinstruction
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57109017A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6221148B2 (enExample
Inventor
Hironori Ono
小野　裕基
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP57109017A priority Critical patent/JPS58225418A/ja
Publication of JPS58225418A publication Critical patent/JPS58225418A/ja
Publication of JPS6221148B2 publication Critical patent/JPS6221148B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57109017A 1982-06-23 1982-06-23 入出力装置の診断制御方式 Granted JPS58225418A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57109017A JPS58225418A (ja) 1982-06-23 1982-06-23 入出力装置の診断制御方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57109017A JPS58225418A (ja) 1982-06-23 1982-06-23 入出力装置の診断制御方式

Publications (2)

Publication Number Publication Date
JPS58225418A true JPS58225418A (ja) 1983-12-27
JPS6221148B2 JPS6221148B2 (enExample) 1987-05-11

Family

ID=14499464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57109017A Granted JPS58225418A (ja) 1982-06-23 1982-06-23 入出力装置の診断制御方式

Country Status (1)

Country Link
JP (1) JPS58225418A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08165670A (ja) * 1994-12-14 1996-06-25 Asahi Concrete Works Co Ltd ケーブル共同溝

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5574651A (en) * 1978-11-30 1980-06-05 Toshiba Corp Data processor having self-diagnosis function
JPS5578531A (en) * 1978-12-08 1980-06-13 Mitsubishi Electric Corp Semiconductor substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5574651A (en) * 1978-11-30 1980-06-05 Toshiba Corp Data processor having self-diagnosis function
JPS5578531A (en) * 1978-12-08 1980-06-13 Mitsubishi Electric Corp Semiconductor substrate

Also Published As

Publication number Publication date
JPS6221148B2 (enExample) 1987-05-11

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