JPS58140479U - 半導体装置の特性測定装置 - Google Patents

半導体装置の特性測定装置

Info

Publication number
JPS58140479U
JPS58140479U JP3736882U JP3736882U JPS58140479U JP S58140479 U JPS58140479 U JP S58140479U JP 3736882 U JP3736882 U JP 3736882U JP 3736882 U JP3736882 U JP 3736882U JP S58140479 U JPS58140479 U JP S58140479U
Authority
JP
Japan
Prior art keywords
semiconductor device
characteristic measuring
semiconductor
test board
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3736882U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6324453Y2 (enrdf_load_stackoverflow
Inventor
黒木　林
Original Assignee
日本電気ホームエレクトロニクス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気ホームエレクトロニクス株式会社 filed Critical 日本電気ホームエレクトロニクス株式会社
Priority to JP3736882U priority Critical patent/JPS58140479U/ja
Publication of JPS58140479U publication Critical patent/JPS58140479U/ja
Application granted granted Critical
Publication of JPS6324453Y2 publication Critical patent/JPS6324453Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3736882U 1982-03-16 1982-03-16 半導体装置の特性測定装置 Granted JPS58140479U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3736882U JPS58140479U (ja) 1982-03-16 1982-03-16 半導体装置の特性測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3736882U JPS58140479U (ja) 1982-03-16 1982-03-16 半導体装置の特性測定装置

Publications (2)

Publication Number Publication Date
JPS58140479U true JPS58140479U (ja) 1983-09-21
JPS6324453Y2 JPS6324453Y2 (enrdf_load_stackoverflow) 1988-07-05

Family

ID=30048760

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3736882U Granted JPS58140479U (ja) 1982-03-16 1982-03-16 半導体装置の特性測定装置

Country Status (1)

Country Link
JP (1) JPS58140479U (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917870U (ja) * 1982-07-24 1984-02-03 利昌工業株式会社 フラット型半導体パッケージ試験用基板
JPS642333A (en) * 1987-06-24 1989-01-06 Tokyo Electron Ltd Element containing tray

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54147172U (enrdf_load_stackoverflow) * 1978-04-04 1979-10-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54147172U (enrdf_load_stackoverflow) * 1978-04-04 1979-10-13

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917870U (ja) * 1982-07-24 1984-02-03 利昌工業株式会社 フラット型半導体パッケージ試験用基板
JPS642333A (en) * 1987-06-24 1989-01-06 Tokyo Electron Ltd Element containing tray

Also Published As

Publication number Publication date
JPS6324453Y2 (enrdf_load_stackoverflow) 1988-07-05

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