JPS642333A - Element containing tray - Google Patents
Element containing trayInfo
- Publication number
- JPS642333A JPS642333A JP62156924A JP15692487A JPS642333A JP S642333 A JPS642333 A JP S642333A JP 62156924 A JP62156924 A JP 62156924A JP 15692487 A JP15692487 A JP 15692487A JP S642333 A JPS642333 A JP S642333A
- Authority
- JP
- Japan
- Prior art keywords
- elements
- tray
- terminals
- containing parts
- contactors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Pile Receivers (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To enable all or a part of the elements on containing parts to be electrically connected to contactors simultaneously by a method wherein terminals for input and output to connect elements are formed at specified positions corresponding to containing parts in specified shape to contain multiple elements.
CONSTITUTION: The title tray 1 is a planar body made of an insulating material in specified shape and size while multiple concave containing parts 3 in size slightly larger than that of elements 2 are formed at specified intervals corresponding to the elements 2 to be contained to contain the elements 2 in the containing parts 3. Then, the terminal pins of elements 2 are connected to respective container parts while terminals 4 for inout and output to be brought into contact with contactors of a test head are formed. The elements 2 are contained in the containing parts 3 of tray 1 to align the terminals 4 with the terminal pins of elements 2 and then each tray 1 is set to a test device while the whole body of tray 1 is specifically aligned with the test device to bring the contactors of test head into contact with the terminals 4. Through these procedures, the elements 2 can be measured.
COPYRIGHT: (C)1989,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62156924A JPH07111992B2 (en) | 1987-06-24 | 1987-06-24 | Device storage tray |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62156924A JPH07111992B2 (en) | 1987-06-24 | 1987-06-24 | Device storage tray |
Publications (3)
Publication Number | Publication Date |
---|---|
JPS642333A true JPS642333A (en) | 1989-01-06 |
JPH012333A JPH012333A (en) | 1989-01-06 |
JPH07111992B2 JPH07111992B2 (en) | 1995-11-29 |
Family
ID=15638348
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62156924A Expired - Lifetime JPH07111992B2 (en) | 1987-06-24 | 1987-06-24 | Device storage tray |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07111992B2 (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54146581A (en) * | 1978-05-09 | 1979-11-15 | Mitsubishi Electric Corp | Electric chracteristic measuring device for semiconductor chip |
JPS58154189A (en) * | 1982-03-10 | 1983-09-13 | 株式会社日立製作所 | Socket for semiconductor element test |
JPS58140479U (en) * | 1982-03-16 | 1983-09-21 | 日本電気ホームエレクトロニクス株式会社 | Semiconductor device characteristic measuring device |
JPS58140477U (en) * | 1982-03-17 | 1983-09-21 | 西日本電線株式会社 | Insulation resistance measurement mechanism |
JPS5914014U (en) * | 1982-07-20 | 1984-01-27 | 日本精機株式会社 | lighting equipment |
JPS5949976U (en) * | 1982-09-24 | 1984-04-03 | 利昌工業株式会社 | Semiconductor test board |
-
1987
- 1987-06-24 JP JP62156924A patent/JPH07111992B2/en not_active Expired - Lifetime
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54146581A (en) * | 1978-05-09 | 1979-11-15 | Mitsubishi Electric Corp | Electric chracteristic measuring device for semiconductor chip |
JPS58154189A (en) * | 1982-03-10 | 1983-09-13 | 株式会社日立製作所 | Socket for semiconductor element test |
JPS58140479U (en) * | 1982-03-16 | 1983-09-21 | 日本電気ホームエレクトロニクス株式会社 | Semiconductor device characteristic measuring device |
JPS58140477U (en) * | 1982-03-17 | 1983-09-21 | 西日本電線株式会社 | Insulation resistance measurement mechanism |
JPS5914014U (en) * | 1982-07-20 | 1984-01-27 | 日本精機株式会社 | lighting equipment |
JPS5949976U (en) * | 1982-09-24 | 1984-04-03 | 利昌工業株式会社 | Semiconductor test board |
Also Published As
Publication number | Publication date |
---|---|
JPH07111992B2 (en) | 1995-11-29 |
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