JPS58140479U - Semiconductor device characteristic measuring device - Google Patents
Semiconductor device characteristic measuring deviceInfo
- Publication number
- JPS58140479U JPS58140479U JP3736882U JP3736882U JPS58140479U JP S58140479 U JPS58140479 U JP S58140479U JP 3736882 U JP3736882 U JP 3736882U JP 3736882 U JP3736882 U JP 3736882U JP S58140479 U JPS58140479 U JP S58140479U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- characteristic measuring
- semiconductor
- test board
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は半導体装置の一例（ミニモールドタイ第３図
プ）を示す斜視図、第２図は本考案の一実施例を示す斜
視図、第３図及び第４図は第２図装置の特性測定動作状
態にある部分拡大平面図及びＸ−Ｘ線に沿う断面図、第
５図乃至第９図は本考案の他の各実施例を説明するため
の部分断面図である。
２．２′・・・・・・リード、３，３’−・・・・・半
導体装置、４．４’、４’、４’竺・・・・・・テスト
ボード、５，５′・・・・・・磁石板、７・・・・・・
測定端子。 ・第２図
１！１１４１FIG. 1 is a perspective view showing an example of a semiconductor device (mini mold tie shown in FIG. 3), FIG. 2 is a perspective view showing an embodiment of the present invention, and FIGS. 3 and 4 are views of the device shown in FIG. FIGS. 5 to 9 are partially enlarged plan views and cross-sectional views taken along line X--X in a state of characteristic measurement operation, and are partial cross-sectional views for explaining other embodiments of the present invention. 2.2'...Lead, 3,3'-...Semiconductor device, 4.4', 4', 4'Test board, 5,5'- ...Magnet plate, 7...
Measurement terminal.・Figure 2 1!1141
Claims (1)
載置面上に半導体装置のリードが適宜接触する測定端子
を固定配置したテストボードと、テストボードに配置さ
れたテストボードに供給された半導体装置を磁気吸引す
る磁石板とを具備したことを特徴とする半導体装置の特
性測定装置。A test board on which a plurality of semiconductor devices are positioned and mounted, and measurement terminals are fixedly arranged on the mounting surface of each semiconductor device so that the leads of the semiconductor devices come into contact as appropriate, and a semiconductor supplied to the test board arranged on the test board. 1. An apparatus for measuring characteristics of a semiconductor device, comprising a magnet plate that magnetically attracts the apparatus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3736882U JPS58140479U (en) | 1982-03-16 | 1982-03-16 | Semiconductor device characteristic measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3736882U JPS58140479U (en) | 1982-03-16 | 1982-03-16 | Semiconductor device characteristic measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58140479U true JPS58140479U (en) | 1983-09-21 |
| JPS6324453Y2 JPS6324453Y2 (en) | 1988-07-05 |
Family
ID=30048760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3736882U Granted JPS58140479U (en) | 1982-03-16 | 1982-03-16 | Semiconductor device characteristic measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58140479U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5917870U (en) * | 1982-07-24 | 1984-02-03 | 利昌工業株式会社 | Flat semiconductor package test substrate |
| JPS642333A (en) * | 1987-06-24 | 1989-01-06 | Tokyo Electron Ltd | Element containing tray |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54147172U (en) * | 1978-04-04 | 1979-10-13 |
-
1982
- 1982-03-16 JP JP3736882U patent/JPS58140479U/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54147172U (en) * | 1978-04-04 | 1979-10-13 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5917870U (en) * | 1982-07-24 | 1984-02-03 | 利昌工業株式会社 | Flat semiconductor package test substrate |
| JPS642333A (en) * | 1987-06-24 | 1989-01-06 | Tokyo Electron Ltd | Element containing tray |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6324453Y2 (en) | 1988-07-05 |
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