JPS58108737A - 半導体装置の製造方法 - Google Patents
半導体装置の製造方法Info
- Publication number
- JPS58108737A JPS58108737A JP57200959A JP20095982A JPS58108737A JP S58108737 A JPS58108737 A JP S58108737A JP 57200959 A JP57200959 A JP 57200959A JP 20095982 A JP20095982 A JP 20095982A JP S58108737 A JPS58108737 A JP S58108737A
- Authority
- JP
- Japan
- Prior art keywords
- oxide film
- semiconductor
- region
- film
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 38
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- 239000012535 impurity Substances 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 13
- 239000000758 substrate Substances 0.000 claims description 11
- 238000010438 heat treatment Methods 0.000 claims description 5
- 125000004437 phosphorous atom Chemical group 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 2
- 239000012212 insulator Substances 0.000 claims 1
- 239000010408 film Substances 0.000 description 77
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 27
- 229910052814 silicon oxide Inorganic materials 0.000 description 26
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 16
- 229910052710 silicon Inorganic materials 0.000 description 16
- 239000010703 silicon Substances 0.000 description 16
- 239000011521 glass Substances 0.000 description 13
- 229920002120 photoresistant polymer Polymers 0.000 description 12
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 10
- 229910052581 Si3N4 Inorganic materials 0.000 description 10
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 10
- 230000003647 oxidation Effects 0.000 description 9
- 238000007254 oxidation reaction Methods 0.000 description 9
- 238000002955 isolation Methods 0.000 description 7
- 229910052698 phosphorus Inorganic materials 0.000 description 7
- 239000011574 phosphorus Substances 0.000 description 7
- 238000009792 diffusion process Methods 0.000 description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 150000001875 compounds Chemical group 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 229920006268 silicone film Polymers 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- NBJBFKVCPBJQMR-APKOLTMOSA-N nff 1 Chemical group C([C@H](NC(=O)[C@H](CCC(N)=O)NC(=O)[C@H](CCC(N)=O)NC(=O)[C@@H]1CCCN1C(=O)[C@H](CCCCN)NC(=O)[C@@H]1CCCN1C(=O)CC=1C2=CC=C(C=C2OC(=O)C=1)OC)C(=O)N[C@@H](CC=1C=CC=CC=1)C(=O)NCC(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](CCCCNC=1C(=CC(=CC=1)[N+]([O-])=O)[N+]([O-])=O)C(=O)NCC(O)=O)C1=CC=CC=C1 NBJBFKVCPBJQMR-APKOLTMOSA-N 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76202—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
- H01L21/76205—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO in a region being recessed from the surface, e.g. in a recess, groove, tub or trench region
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57200959A JPS58108737A (ja) | 1982-11-15 | 1982-11-15 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57200959A JPS58108737A (ja) | 1982-11-15 | 1982-11-15 | 半導体装置の製造方法 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51114052A Division JPS6035818B2 (ja) | 1976-09-22 | 1976-09-22 | 半導体装置の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58108737A true JPS58108737A (ja) | 1983-06-28 |
JPS6229889B2 JPS6229889B2 (enrdf_load_stackoverflow) | 1987-06-29 |
Family
ID=16433150
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57200959A Granted JPS58108737A (ja) | 1982-11-15 | 1982-11-15 | 半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58108737A (enrdf_load_stackoverflow) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50154077A (enrdf_load_stackoverflow) * | 1974-05-22 | 1975-12-11 | ||
JPS5140773A (en) * | 1974-07-25 | 1976-04-05 | Siemens Ag | Handotaidebaisuno seizohoho |
-
1982
- 1982-11-15 JP JP57200959A patent/JPS58108737A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50154077A (enrdf_load_stackoverflow) * | 1974-05-22 | 1975-12-11 | ||
JPS5140773A (en) * | 1974-07-25 | 1976-04-05 | Siemens Ag | Handotaidebaisuno seizohoho |
Also Published As
Publication number | Publication date |
---|---|
JPS6229889B2 (enrdf_load_stackoverflow) | 1987-06-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4191595A (en) | Method of manufacturing PN junctions in a semiconductor region to reach an isolation layer without exposing the semiconductor region surface | |
JPH0521450A (ja) | 半導体装置及びその製造方法 | |
JPS58108737A (ja) | 半導体装置の製造方法 | |
JPS5850753A (ja) | 半導体装置の製造方法 | |
JPS61135136A (ja) | 半導体装置の製造方法 | |
JPS59107572A (ja) | 半導体装置の製造方法 | |
JPH0335528A (ja) | 半導体装置の製造方法 | |
JPS5986238A (ja) | 半導体装置の製造方法 | |
JPS6229890B2 (enrdf_load_stackoverflow) | ||
JPS5984543A (ja) | バイポ−ラ集積回路装置およびその製造方法 | |
JPS59191380A (ja) | 半導体装置とその製造方法 | |
JPS6245065A (ja) | 半導体装置の製造方法 | |
JPS6115589B2 (enrdf_load_stackoverflow) | ||
JPH01119064A (ja) | 半導体装置の製造方法 | |
JPS61112375A (ja) | 半導体装置の製造方法 | |
JPS59177941A (ja) | 素子分離領域の製造方法 | |
JPH0475349A (ja) | 半導体装置の製造方法 | |
JPH01145858A (ja) | 半導体装置の製造方法 | |
JPS60249364A (ja) | 半導体装置の製造方法 | |
JPS60170258A (ja) | 半導体装置の製造方法 | |
JPH0278227A (ja) | コレクタ分離拡散トランジスタとその製造方法 | |
JPH0191445A (ja) | 半導体集積回路装置の製造方法 | |
JPS6143476A (ja) | Mos形半導体装置およびその製造方法 | |
JPS639150A (ja) | 半導体装置の製造方法 | |
JPH04217342A (ja) | 半導体装置の製造方法 |