JPS573298A - Memory integrated circuit - Google Patents
Memory integrated circuitInfo
- Publication number
- JPS573298A JPS573298A JP7644180A JP7644180A JPS573298A JP S573298 A JPS573298 A JP S573298A JP 7644180 A JP7644180 A JP 7644180A JP 7644180 A JP7644180 A JP 7644180A JP S573298 A JPS573298 A JP S573298A
- Authority
- JP
- Japan
- Prior art keywords
- blocks
- circuit
- memory cell
- accessed
- selecting circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
Landscapes
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7644180A JPS573298A (en) | 1980-06-06 | 1980-06-06 | Memory integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7644180A JPS573298A (en) | 1980-06-06 | 1980-06-06 | Memory integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS573298A true JPS573298A (en) | 1982-01-08 |
Family
ID=13605232
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7644180A Pending JPS573298A (en) | 1980-06-06 | 1980-06-06 | Memory integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS573298A (ja) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58184930U (ja) * | 1982-06-02 | 1983-12-08 | 三洋電機株式会社 | トランジスタ・スイツチング回路 |
JPS59175095A (ja) * | 1983-03-22 | 1984-10-03 | Mitsubishi Electric Corp | 半導体メモリ |
JPS6015899A (ja) * | 1983-07-08 | 1985-01-26 | Hitachi Micro Comput Eng Ltd | 記憶装置 |
JPS60115099A (ja) * | 1983-11-25 | 1985-06-21 | Fujitsu Ltd | 半導体記憶装置 |
EP0186051A2 (de) * | 1984-12-28 | 1986-07-02 | Siemens Aktiengesellschaft | Integrierter Halbleiterspeicher |
JPS61158099A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
EP0193210A2 (en) * | 1985-02-28 | 1986-09-03 | Nec Corporation | Semiconductor memory device with a built-in test circuit |
JPH02180000A (ja) * | 1988-12-31 | 1990-07-12 | Samsung Electron Co Ltd | 高密度メモリのテスト用並列リード回路 |
-
1980
- 1980-06-06 JP JP7644180A patent/JPS573298A/ja active Pending
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58184930U (ja) * | 1982-06-02 | 1983-12-08 | 三洋電機株式会社 | トランジスタ・スイツチング回路 |
JPH0224277Y2 (ja) * | 1982-06-02 | 1990-07-03 | ||
JPS59175095A (ja) * | 1983-03-22 | 1984-10-03 | Mitsubishi Electric Corp | 半導体メモリ |
JPS6015899A (ja) * | 1983-07-08 | 1985-01-26 | Hitachi Micro Comput Eng Ltd | 記憶装置 |
JPS60115099A (ja) * | 1983-11-25 | 1985-06-21 | Fujitsu Ltd | 半導体記憶装置 |
JPH0463480B2 (ja) * | 1983-11-25 | 1992-10-09 | Fujitsu Ltd | |
EP0186051A2 (de) * | 1984-12-28 | 1986-07-02 | Siemens Aktiengesellschaft | Integrierter Halbleiterspeicher |
JPS61158099A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
JPS61158100A (ja) * | 1984-12-28 | 1986-07-17 | シーメンス、アクチエンゲゼルシヤフト | 集積半導体メモリ |
EP0193210A2 (en) * | 1985-02-28 | 1986-09-03 | Nec Corporation | Semiconductor memory device with a built-in test circuit |
JPS621200A (ja) * | 1985-02-28 | 1987-01-07 | Nec Corp | 半導体メモリ |
JPH02180000A (ja) * | 1988-12-31 | 1990-07-12 | Samsung Electron Co Ltd | 高密度メモリのテスト用並列リード回路 |
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