JPS57211143A - Formation of micropattern - Google Patents
Formation of micropatternInfo
- Publication number
- JPS57211143A JPS57211143A JP9591681A JP9591681A JPS57211143A JP S57211143 A JPS57211143 A JP S57211143A JP 9591681 A JP9591681 A JP 9591681A JP 9591681 A JP9591681 A JP 9591681A JP S57211143 A JPS57211143 A JP S57211143A
- Authority
- JP
- Japan
- Prior art keywords
- film
- pattern
- resist
- silylating
- permitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
PURPOSE:To facilitate dry patterning of a resist film, by using a photosensitive resist consisting of a mixture of a photosensitive resin and a silylating or acylating agent. CONSTITUTION:A photosensitive resist layer 13 composed of a radiation-sensitive resin, such as polyacrylate, and a silylating or acylating agent is formed on the heat-oxidized film of silicon 12 provided on a semiconductor substrate 11. The resist film 13 is irradiated with electron beams 14 in accordance with a prescribed pattern. The substrate 11 is set in an etching tunnel 16, and exposed to oxygen plasma to remove the parts of the film 13 not exposed to the electron beams 14, thus permitting a resist film pattern 13a to be formed. The unnecessary parts of the film 12 are removed by ion etching using the pattern 13a as a protective film, and further, the pattern 13a is removed, thus permitting the film 12 to be patterned.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9591681A JPS57211143A (en) | 1981-06-23 | 1981-06-23 | Formation of micropattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9591681A JPS57211143A (en) | 1981-06-23 | 1981-06-23 | Formation of micropattern |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57211143A true JPS57211143A (en) | 1982-12-24 |
JPH0243172B2 JPH0243172B2 (en) | 1990-09-27 |
Family
ID=14150597
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9591681A Granted JPS57211143A (en) | 1981-06-23 | 1981-06-23 | Formation of micropattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57211143A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61248035A (en) * | 1985-04-26 | 1986-11-05 | Nippon Zeon Co Ltd | Photoresist composition having improved adhesion property |
JPS62137830A (en) * | 1985-12-12 | 1987-06-20 | Mitsubishi Electric Corp | Fine-pattern forming method |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53135621A (en) * | 1977-05-02 | 1978-11-27 | Hitachi Ltd | Photosensitive composition |
JPS5427369A (en) * | 1977-08-01 | 1979-03-01 | Hitachi Ltd | Pattern formation method |
JPS5449072A (en) * | 1977-09-26 | 1979-04-18 | Mitsubishi Electric Corp | Developing method for resist film |
JPS5460571A (en) * | 1977-10-24 | 1979-05-16 | Cho Lsi Gijutsu Kenkyu Kumiai | Dry developing and etching method |
JPS57157241A (en) * | 1981-03-25 | 1982-09-28 | Oki Electric Ind Co Ltd | Formation of resist material and its pattern |
JPS57202533A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Formation of pattern |
JPS57202534A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Negative type resist composition |
JPS57202535A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Formation of negative resist pattern |
JPS57202532A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Formation of pattern |
JPS57202537A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Resist composition for dry development |
JPS57205736A (en) * | 1981-04-22 | 1982-12-16 | Western Electric Co | Solid state device produced by plasm development of resist |
-
1981
- 1981-06-23 JP JP9591681A patent/JPS57211143A/en active Granted
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53135621A (en) * | 1977-05-02 | 1978-11-27 | Hitachi Ltd | Photosensitive composition |
JPS5427369A (en) * | 1977-08-01 | 1979-03-01 | Hitachi Ltd | Pattern formation method |
JPS5449072A (en) * | 1977-09-26 | 1979-04-18 | Mitsubishi Electric Corp | Developing method for resist film |
JPS5460571A (en) * | 1977-10-24 | 1979-05-16 | Cho Lsi Gijutsu Kenkyu Kumiai | Dry developing and etching method |
JPS57157241A (en) * | 1981-03-25 | 1982-09-28 | Oki Electric Ind Co Ltd | Formation of resist material and its pattern |
JPS57205736A (en) * | 1981-04-22 | 1982-12-16 | Western Electric Co | Solid state device produced by plasm development of resist |
JPS57202533A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Formation of pattern |
JPS57202534A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Negative type resist composition |
JPS57202535A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Formation of negative resist pattern |
JPS57202532A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Formation of pattern |
JPS57202537A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Resist composition for dry development |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61248035A (en) * | 1985-04-26 | 1986-11-05 | Nippon Zeon Co Ltd | Photoresist composition having improved adhesion property |
JPS62137830A (en) * | 1985-12-12 | 1987-06-20 | Mitsubishi Electric Corp | Fine-pattern forming method |
Also Published As
Publication number | Publication date |
---|---|
JPH0243172B2 (en) | 1990-09-27 |
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