JPS57184907A - Method of detecting minute deformation strain using magnetic bubble - Google Patents
Method of detecting minute deformation strain using magnetic bubbleInfo
- Publication number
- JPS57184907A JPS57184907A JP6985781A JP6985781A JPS57184907A JP S57184907 A JPS57184907 A JP S57184907A JP 6985781 A JP6985781 A JP 6985781A JP 6985781 A JP6985781 A JP 6985781A JP S57184907 A JPS57184907 A JP S57184907A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- magnetic field
- magnetic
- extinction
- deformation strain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B7/24—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in magnetic properties
Abstract
PURPOSE:To detect a deformation strain produced at a minute area, by a method wherein a magnetic garnet, whereon lattice-shaped bubble are formed, is firmly adhered to an object to be measured to detect an extinction magnetic field value of a magnetic valve. CONSTITUTION:A garnet chip 3 is firmly adhered to an object to be measured by the use of a silicon adhesive agent so that no adhesion strain is produced. A uniaxial anisotropic magnetic field Hk is caused to act on the chip 3 beforehand to form a large number of lattic-shaped bubble, and the Hk and an extinction magnetic field Ho are measured. While a magnetic field is being vertically applied to the chip surface, the extinction magnetic field Ho is measured over a-b using a polarized microscope to find a change amount DELTAHo. The DELTAHo changes in proportion to a stress in a magnetic garnet crystal film, and as a result, a deformation strain of an object to be measured is measured with a position accuracy of several tens mum.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6985781A JPS57184907A (en) | 1981-05-08 | 1981-05-08 | Method of detecting minute deformation strain using magnetic bubble |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6985781A JPS57184907A (en) | 1981-05-08 | 1981-05-08 | Method of detecting minute deformation strain using magnetic bubble |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57184907A true JPS57184907A (en) | 1982-11-13 |
JPS6316681B2 JPS6316681B2 (en) | 1988-04-11 |
Family
ID=13414892
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6985781A Granted JPS57184907A (en) | 1981-05-08 | 1981-05-08 | Method of detecting minute deformation strain using magnetic bubble |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57184907A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015002319A1 (en) * | 2013-07-04 | 2015-01-08 | ローム株式会社 | Stress sensor |
-
1981
- 1981-05-08 JP JP6985781A patent/JPS57184907A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015002319A1 (en) * | 2013-07-04 | 2015-01-08 | ローム株式会社 | Stress sensor |
JP2015014489A (en) * | 2013-07-04 | 2015-01-22 | ローム株式会社 | Stress sensor |
Also Published As
Publication number | Publication date |
---|---|
JPS6316681B2 (en) | 1988-04-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0350383A3 (en) | Twisted nematic liquid crystal display device | |
ATE451716T1 (en) | METHOD FOR DETECTING CRYSTAL DEFECTS AND/OR STRESS FIELDS IN THE CONTACT SURFACE OF TWO CONNECTED MATERIALS | |
JPS57184907A (en) | Method of detecting minute deformation strain using magnetic bubble | |
JPS5638033A (en) | In-finder display device for camera using liquid crystal | |
TW500931B (en) | Method for manufacturing polarizing plate and liquid crystal display device | |
JPS544066A (en) | Growing method of silicon crystal under low pressure | |
JPS5632124A (en) | Sealing method of liquid crystal display plate | |
JPS57128074A (en) | Semiconductor pressure sensor | |
CN206146572U (en) | High sensitivity integrated pressure sensor | |
GB1417801A (en) | Integrated single crystal pressure transducer | |
JPS56104308A (en) | Protective film for polarizing plate | |
JPS5750479A (en) | Detector for detecting pressure and pressure difference of semiconductor | |
JPS5730808A (en) | Polarizing plate | |
JPS5692520A (en) | Liquid crystal display device | |
GB1464079A (en) | Method of determining possible dimensional variations in a workpiece | |
JPS5593127A (en) | Thin type tn-type liquid crystal display device | |
GB841772A (en) | Improvements relating to photo-elasticimetric systems | |
JPS55103441A (en) | Pressure converter | |
JPS52132853A (en) | Liquid crystal indication device | |
JPS569724A (en) | Liquid crystal display device | |
JPS5327417A (en) | Magnetic head | |
JPS6421977A (en) | Magnetoresistance element | |
JPS5619422A (en) | Strain detector | |
JPS5788431A (en) | Polarization plate for liquid crystal display element | |
SU1835913A1 (en) | Integral semiconductor pressure transducer and process of its manufacture |