JPS57164497A - Controlling device of address fail memory - Google Patents

Controlling device of address fail memory

Info

Publication number
JPS57164497A
JPS57164497A JP56048048A JP4804881A JPS57164497A JP S57164497 A JPS57164497 A JP S57164497A JP 56048048 A JP56048048 A JP 56048048A JP 4804881 A JP4804881 A JP 4804881A JP S57164497 A JPS57164497 A JP S57164497A
Authority
JP
Japan
Prior art keywords
address
memory
data
multiplexer
background
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56048048A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6232559B2 (enrdf_load_stackoverflow
Inventor
Tsutomu Miyazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56048048A priority Critical patent/JPS57164497A/ja
Publication of JPS57164497A publication Critical patent/JPS57164497A/ja
Publication of JPS6232559B2 publication Critical patent/JPS6232559B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56048048A 1981-03-31 1981-03-31 Controlling device of address fail memory Granted JPS57164497A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56048048A JPS57164497A (en) 1981-03-31 1981-03-31 Controlling device of address fail memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56048048A JPS57164497A (en) 1981-03-31 1981-03-31 Controlling device of address fail memory

Publications (2)

Publication Number Publication Date
JPS57164497A true JPS57164497A (en) 1982-10-09
JPS6232559B2 JPS6232559B2 (enrdf_load_stackoverflow) 1987-07-15

Family

ID=12792439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56048048A Granted JPS57164497A (en) 1981-03-31 1981-03-31 Controlling device of address fail memory

Country Status (1)

Country Link
JP (1) JPS57164497A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6050698A (ja) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp 半導体試験装置
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis
JP2007257723A (ja) * 2006-03-23 2007-10-04 Yokogawa Electric Corp メモリテスト装置
JP2008020238A (ja) * 2006-07-11 2008-01-31 Yokogawa Electric Corp 信号処理装置及び半導体集積回路試験装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55113200A (en) * 1979-02-22 1980-09-01 Nec Corp Checking method for ic memory

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55113200A (en) * 1979-02-22 1980-09-01 Nec Corp Checking method for ic memory

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6050698A (ja) * 1983-08-26 1985-03-20 Mitsubishi Electric Corp 半導体試験装置
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis
JP2007257723A (ja) * 2006-03-23 2007-10-04 Yokogawa Electric Corp メモリテスト装置
JP2008020238A (ja) * 2006-07-11 2008-01-31 Yokogawa Electric Corp 信号処理装置及び半導体集積回路試験装置

Also Published As

Publication number Publication date
JPS6232559B2 (enrdf_load_stackoverflow) 1987-07-15

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