JPS6425400A - Circuit for testing access time - Google Patents
Circuit for testing access timeInfo
- Publication number
- JPS6425400A JPS6425400A JP62181148A JP18114887A JPS6425400A JP S6425400 A JPS6425400 A JP S6425400A JP 62181148 A JP62181148 A JP 62181148A JP 18114887 A JP18114887 A JP 18114887A JP S6425400 A JPS6425400 A JP S6425400A
- Authority
- JP
- Japan
- Prior art keywords
- address
- memory
- tested
- selector
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
PURPOSE:To execute the measurement of more exact access time by feeding back address information to be read out from a memory to be tested as an address signal through a feedback address circuit and a selector and forming the reading actuation of the memory to be tested. CONSTITUTION:When a value of zero is set in external address signal inputs A0-A7 while a read-write selecting terminal 4 is made into '0' and the memory 1 to be tested is held in a reading state, the memory 1 to be tested selects a zero address and an address signal with the value 1 corresponding to the address information stored in the above is outputted on a feedback address circuit 5. Under this state, when an selector switching terminal 3 is made into '1' and a selector 2 is switched to the input side of the feedback address signal, the memory 1 to be tested selects the one address this time, since it newly accepts, as its own address, the address signal with the value of one fed back through the feedback address circuit 5 and the selector 2. Thus, the continuous reading out actuation of the tested memory 1 is formed. By this reason, the measurement of the more exact access time can be executed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62181148A JPS6425400A (en) | 1987-07-22 | 1987-07-22 | Circuit for testing access time |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62181148A JPS6425400A (en) | 1987-07-22 | 1987-07-22 | Circuit for testing access time |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6425400A true JPS6425400A (en) | 1989-01-27 |
Family
ID=16095723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62181148A Pending JPS6425400A (en) | 1987-07-22 | 1987-07-22 | Circuit for testing access time |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6425400A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6115783A (en) * | 1996-08-15 | 2000-09-05 | Nec Corporation | Integrated circuit |
-
1987
- 1987-07-22 JP JP62181148A patent/JPS6425400A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6115783A (en) * | 1996-08-15 | 2000-09-05 | Nec Corporation | Integrated circuit |
US6321291B1 (en) | 1996-08-15 | 2001-11-20 | Nec Corporation | Method of measuring the speed of a memory unit in an integrated circuit |
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