JPS57109335A - Positional matching method between mask substrate and wafer - Google Patents
Positional matching method between mask substrate and waferInfo
- Publication number
- JPS57109335A JPS57109335A JP55185906A JP18590680A JPS57109335A JP S57109335 A JPS57109335 A JP S57109335A JP 55185906 A JP55185906 A JP 55185906A JP 18590680 A JP18590680 A JP 18590680A JP S57109335 A JPS57109335 A JP S57109335A
- Authority
- JP
- Japan
- Prior art keywords
- mask substrate
- wafer
- matching reference
- masks
- matching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title abstract 7
- 235000012431 wafers Nutrition 0.000 abstract 8
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electron Beam Exposure (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55185906A JPS57109335A (en) | 1980-12-26 | 1980-12-26 | Positional matching method between mask substrate and wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55185906A JPS57109335A (en) | 1980-12-26 | 1980-12-26 | Positional matching method between mask substrate and wafer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57109335A true JPS57109335A (en) | 1982-07-07 |
JPS6142410B2 JPS6142410B2 (enrdf_load_stackoverflow) | 1986-09-20 |
Family
ID=16178945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55185906A Granted JPS57109335A (en) | 1980-12-26 | 1980-12-26 | Positional matching method between mask substrate and wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57109335A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59134830A (ja) * | 1982-12-30 | 1984-08-02 | トムソン−セ−エスエフ | 2つのクロ−ズアツプ平面上のパタ−ンの光学的配列方法およびその装置 |
JPS60173835A (ja) * | 1984-01-30 | 1985-09-07 | Nippon Telegr & Teleph Corp <Ntt> | 回折格子によるギヤツプ制御法 |
-
1980
- 1980-12-26 JP JP55185906A patent/JPS57109335A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59134830A (ja) * | 1982-12-30 | 1984-08-02 | トムソン−セ−エスエフ | 2つのクロ−ズアツプ平面上のパタ−ンの光学的配列方法およびその装置 |
JPS60173835A (ja) * | 1984-01-30 | 1985-09-07 | Nippon Telegr & Teleph Corp <Ntt> | 回折格子によるギヤツプ制御法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6142410B2 (enrdf_load_stackoverflow) | 1986-09-20 |
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