JPS5690246A - Optical defect detection device - Google Patents

Optical defect detection device

Info

Publication number
JPS5690246A
JPS5690246A JP16885479A JP16885479A JPS5690246A JP S5690246 A JPS5690246 A JP S5690246A JP 16885479 A JP16885479 A JP 16885479A JP 16885479 A JP16885479 A JP 16885479A JP S5690246 A JPS5690246 A JP S5690246A
Authority
JP
Japan
Prior art keywords
disc
defect
detect
light
constitution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16885479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6250774B2 (enrdf_load_stackoverflow
Inventor
Takafumi Sugano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16885479A priority Critical patent/JPS5690246A/ja
Publication of JPS5690246A publication Critical patent/JPS5690246A/ja
Publication of JPS6250774B2 publication Critical patent/JPS6250774B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Recording Or Reproduction (AREA)
JP16885479A 1979-12-24 1979-12-24 Optical defect detection device Granted JPS5690246A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16885479A JPS5690246A (en) 1979-12-24 1979-12-24 Optical defect detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16885479A JPS5690246A (en) 1979-12-24 1979-12-24 Optical defect detection device

Publications (2)

Publication Number Publication Date
JPS5690246A true JPS5690246A (en) 1981-07-22
JPS6250774B2 JPS6250774B2 (enrdf_load_stackoverflow) 1987-10-27

Family

ID=15875775

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16885479A Granted JPS5690246A (en) 1979-12-24 1979-12-24 Optical defect detection device

Country Status (1)

Country Link
JP (1) JPS5690246A (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60171651A (ja) * 1984-02-17 1985-09-05 Toshiba Corp デイスク検査方法
JPS61104440A (ja) * 1984-10-26 1986-05-22 Toshiba Ii M I Kk 記録媒体の非接触式欠陥検出方法及び装置
JPS61104439A (ja) * 1984-10-26 1986-05-22 Toshiba Ii M I Kk 記録媒体の非接触式欠陥検出方法及び装置
JPS6267431A (ja) * 1985-09-20 1987-03-27 Hitachi Electronics Eng Co Ltd 自動装填式デイスク型記録媒体検査装置
US8142693B2 (en) 2009-01-23 2012-03-27 Kabushiki Kaisha Toshiba Stamper and stamper evaluation method

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03119474U (enrdf_load_stackoverflow) * 1990-03-17 1991-12-10
JPH07284718A (ja) * 1994-04-18 1995-10-31 Toshiharu Osaka 目地塗装用ローラーカバーとそのローラー

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52146601A (en) * 1976-05-28 1977-12-06 Rca Corp Method of detecting defect of vortex groove formed on disk surface and device therefor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52146601A (en) * 1976-05-28 1977-12-06 Rca Corp Method of detecting defect of vortex groove formed on disk surface and device therefor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60171651A (ja) * 1984-02-17 1985-09-05 Toshiba Corp デイスク検査方法
JPS61104440A (ja) * 1984-10-26 1986-05-22 Toshiba Ii M I Kk 記録媒体の非接触式欠陥検出方法及び装置
JPS61104439A (ja) * 1984-10-26 1986-05-22 Toshiba Ii M I Kk 記録媒体の非接触式欠陥検出方法及び装置
JPS6267431A (ja) * 1985-09-20 1987-03-27 Hitachi Electronics Eng Co Ltd 自動装填式デイスク型記録媒体検査装置
US8142693B2 (en) 2009-01-23 2012-03-27 Kabushiki Kaisha Toshiba Stamper and stamper evaluation method

Also Published As

Publication number Publication date
JPS6250774B2 (enrdf_load_stackoverflow) 1987-10-27

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