JPS5661659A - Device for testing and evaluation of semiconductor integrated circuit - Google Patents

Device for testing and evaluation of semiconductor integrated circuit

Info

Publication number
JPS5661659A
JPS5661659A JP13746279A JP13746279A JPS5661659A JP S5661659 A JPS5661659 A JP S5661659A JP 13746279 A JP13746279 A JP 13746279A JP 13746279 A JP13746279 A JP 13746279A JP S5661659 A JPS5661659 A JP S5661659A
Authority
JP
Japan
Prior art keywords
circuit
sample
samples
pass
fail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13746279A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6262300B2 (enrdf_load_stackoverflow
Inventor
Kenichi Nagatome
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP13746279A priority Critical patent/JPS5661659A/ja
Publication of JPS5661659A publication Critical patent/JPS5661659A/ja
Publication of JPS6262300B2 publication Critical patent/JPS6262300B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP13746279A 1979-10-24 1979-10-24 Device for testing and evaluation of semiconductor integrated circuit Granted JPS5661659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13746279A JPS5661659A (en) 1979-10-24 1979-10-24 Device for testing and evaluation of semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13746279A JPS5661659A (en) 1979-10-24 1979-10-24 Device for testing and evaluation of semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPS5661659A true JPS5661659A (en) 1981-05-27
JPS6262300B2 JPS6262300B2 (enrdf_load_stackoverflow) 1987-12-25

Family

ID=15199163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13746279A Granted JPS5661659A (en) 1979-10-24 1979-10-24 Device for testing and evaluation of semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS5661659A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6262300B2 (enrdf_load_stackoverflow) 1987-12-25

Similar Documents

Publication Publication Date Title
JPS6469974A (en) Method and apparatus for diagnosing fault on circuit board
EP0216941A4 (en) DEVICE FOR ANALYZING THE TRANSMISSION / REFLECTION CHARACTERISTICS OF TWO CHANNELS.
JPS6491074A (en) Memory-contained logic lsi and testing thereof
EP0428465A3 (en) Method and apparatus for detecting oscillator stuck faults in a level sensitive scan design (lssd) system
JPS5661659A (en) Device for testing and evaluation of semiconductor integrated circuit
JPS5427755A (en) Circuit testing equipment
JPS6443773A (en) Propagation delay testing method for logic circuit
JPS578411A (en) Testing system
JPS57113377A (en) Semiconductor testing device
JPS5679268A (en) Inspection apparatus for integrated circuit
JPS56116637A (en) Detector for semiconductor device
JPS5640756A (en) Automatic evaluation device for steel material
JPS5760865A (en) Integrated circuit device
JPS57169683A (en) Measuring device for electric current consumption
JPS55164948A (en) Test system for logic circuit package
JPS5683045A (en) Wafer probe
JPS5651677A (en) Testing method
JPS57128938A (en) Device for measuring characteristic of semiconductor
JPS6491069A (en) Insulation tester by partial discharge method
JPS57111714A (en) Integrated circuit
JPS5655875A (en) Testing device for integrated circuit
JPS56158442A (en) Wafer test device
JPS57204459A (en) Connected monitoring circuit
JPS55113968A (en) Method of testing integrated circuit
JPS6415675A (en) Circuit for testing integrated circuit