JPS57204459A - Connected monitoring circuit - Google Patents

Connected monitoring circuit

Info

Publication number
JPS57204459A
JPS57204459A JP56089562A JP8956281A JPS57204459A JP S57204459 A JPS57204459 A JP S57204459A JP 56089562 A JP56089562 A JP 56089562A JP 8956281 A JP8956281 A JP 8956281A JP S57204459 A JPS57204459 A JP S57204459A
Authority
JP
Japan
Prior art keywords
pulse
output terminal
transformer
socket
contacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56089562A
Other languages
Japanese (ja)
Inventor
Kiyoshi Matsui
Kunio Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56089562A priority Critical patent/JPS57204459A/en
Publication of JPS57204459A publication Critical patent/JPS57204459A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE:To detect contact failure of an object to be connected and a tester in case of testing and measuring electronic parts, by detecting an impedance variation of the primary side of a pulse transformer connected between contacts of a socket. CONSTITUTION:When a lead pin 4 of a transistor 8 is satisfactorily connected to a pair of contacts 17, 18 of a socket 7, a secondary side circuit of a pulse transformer 23 is in a short-crcuited state, and when a pulse has been applied to an input terminal 25, a zero pulse is detected by an output terminal 26. On the other hand, in the event of contact failure, the secondary side circuit of the transformer 23 is in an open state, and the primary side of the transofmer 23 operates as high impedance, therefore, an effective pulse is detected by the output terminal 26. Accordingly, whether the connecting state is satisfactory or not can be decided by detecting whether a pulse exists in the output terminal or not.
JP56089562A 1981-06-12 1981-06-12 Connected monitoring circuit Pending JPS57204459A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56089562A JPS57204459A (en) 1981-06-12 1981-06-12 Connected monitoring circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56089562A JPS57204459A (en) 1981-06-12 1981-06-12 Connected monitoring circuit

Publications (1)

Publication Number Publication Date
JPS57204459A true JPS57204459A (en) 1982-12-15

Family

ID=13974254

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56089562A Pending JPS57204459A (en) 1981-06-12 1981-06-12 Connected monitoring circuit

Country Status (1)

Country Link
JP (1) JPS57204459A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0829731A2 (en) * 1996-09-17 1998-03-18 Lucent Technologies Inc. Ultra high reliability electrical contacts
US6734683B2 (en) * 2001-09-27 2004-05-11 Intel Corporation Method and apparatus for in-circuit testing of sockets

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0829731A2 (en) * 1996-09-17 1998-03-18 Lucent Technologies Inc. Ultra high reliability electrical contacts
EP0829731A3 (en) * 1996-09-17 1998-04-29 Lucent Technologies Inc. Ultra high reliability electrical contacts
US6734683B2 (en) * 2001-09-27 2004-05-11 Intel Corporation Method and apparatus for in-circuit testing of sockets
CN100347557C (en) * 2001-09-27 2007-11-07 英特尔公司 Method and apparatus for in-circuit testing of sockets

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