JPS57204459A - Connected monitoring circuit - Google Patents
Connected monitoring circuitInfo
- Publication number
- JPS57204459A JPS57204459A JP56089562A JP8956281A JPS57204459A JP S57204459 A JPS57204459 A JP S57204459A JP 56089562 A JP56089562 A JP 56089562A JP 8956281 A JP8956281 A JP 8956281A JP S57204459 A JPS57204459 A JP S57204459A
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- output terminal
- transformer
- socket
- contacts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
PURPOSE:To detect contact failure of an object to be connected and a tester in case of testing and measuring electronic parts, by detecting an impedance variation of the primary side of a pulse transformer connected between contacts of a socket. CONSTITUTION:When a lead pin 4 of a transistor 8 is satisfactorily connected to a pair of contacts 17, 18 of a socket 7, a secondary side circuit of a pulse transformer 23 is in a short-crcuited state, and when a pulse has been applied to an input terminal 25, a zero pulse is detected by an output terminal 26. On the other hand, in the event of contact failure, the secondary side circuit of the transformer 23 is in an open state, and the primary side of the transofmer 23 operates as high impedance, therefore, an effective pulse is detected by the output terminal 26. Accordingly, whether the connecting state is satisfactory or not can be decided by detecting whether a pulse exists in the output terminal or not.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56089562A JPS57204459A (en) | 1981-06-12 | 1981-06-12 | Connected monitoring circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56089562A JPS57204459A (en) | 1981-06-12 | 1981-06-12 | Connected monitoring circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57204459A true JPS57204459A (en) | 1982-12-15 |
Family
ID=13974254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56089562A Pending JPS57204459A (en) | 1981-06-12 | 1981-06-12 | Connected monitoring circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57204459A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0829731A2 (en) * | 1996-09-17 | 1998-03-18 | Lucent Technologies Inc. | Ultra high reliability electrical contacts |
US6734683B2 (en) * | 2001-09-27 | 2004-05-11 | Intel Corporation | Method and apparatus for in-circuit testing of sockets |
-
1981
- 1981-06-12 JP JP56089562A patent/JPS57204459A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0829731A2 (en) * | 1996-09-17 | 1998-03-18 | Lucent Technologies Inc. | Ultra high reliability electrical contacts |
EP0829731A3 (en) * | 1996-09-17 | 1998-04-29 | Lucent Technologies Inc. | Ultra high reliability electrical contacts |
US6734683B2 (en) * | 2001-09-27 | 2004-05-11 | Intel Corporation | Method and apparatus for in-circuit testing of sockets |
CN100347557C (en) * | 2001-09-27 | 2007-11-07 | 英特尔公司 | Method and apparatus for in-circuit testing of sockets |
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