JPS57111425A - Detector of ic chip temperature - Google Patents

Detector of ic chip temperature

Info

Publication number
JPS57111425A
JPS57111425A JP18788980A JP18788980A JPS57111425A JP S57111425 A JPS57111425 A JP S57111425A JP 18788980 A JP18788980 A JP 18788980A JP 18788980 A JP18788980 A JP 18788980A JP S57111425 A JPS57111425 A JP S57111425A
Authority
JP
Japan
Prior art keywords
temperature
diode
voltage
chip
forward voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18788980A
Other languages
Japanese (ja)
Inventor
Umeo Oshio
Yoshiaki Kahata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18788980A priority Critical patent/JPS57111425A/en
Publication of JPS57111425A publication Critical patent/JPS57111425A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

PURPOSE:To realize the detection for the temperature within a transistor TR although the TR of an IC is in operation, by providing a diode plus a circuit which detects the change of the forward voltage of the diode on an IC chip. CONSTITUTION:A diode D is set on an IC chip 1 to which a TR to be measured for its temperature is provided. Then the positive voltage is applied to the anode side, and the cathode side is earthed. The forward voltage of the diode D is applied to an input terminal of a comparator C of an external circuit, and the reference voltage Vref is supplied to the other input terminal. A regression line between the temperature and the output forward voltage of the comparator C is used to detect the temperature of the TR from the change of the output voltage. Thus the temperature of a TR can be detected although the TR is in operation.
JP18788980A 1980-12-29 1980-12-29 Detector of ic chip temperature Pending JPS57111425A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18788980A JPS57111425A (en) 1980-12-29 1980-12-29 Detector of ic chip temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18788980A JPS57111425A (en) 1980-12-29 1980-12-29 Detector of ic chip temperature

Publications (1)

Publication Number Publication Date
JPS57111425A true JPS57111425A (en) 1982-07-10

Family

ID=16213958

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18788980A Pending JPS57111425A (en) 1980-12-29 1980-12-29 Detector of ic chip temperature

Country Status (1)

Country Link
JP (1) JPS57111425A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0217620A2 (en) * 1985-09-25 1987-04-08 Imi Pactrol Limited Temperature sensor
EP0256715A2 (en) * 1986-08-18 1988-02-24 Siliconix Limited Temperature sensing apparatus
JPS63292028A (en) * 1987-05-26 1988-11-29 Nec Corp Electronic-circuit protecting apparatus
JPH02266241A (en) * 1989-04-07 1990-10-31 Nec Corp Temperature detector for logic module
US6679628B2 (en) * 2001-08-14 2004-01-20 Schneider Automation Inc. Solid state temperature measuring device and method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0217620A2 (en) * 1985-09-25 1987-04-08 Imi Pactrol Limited Temperature sensor
EP0256715A2 (en) * 1986-08-18 1988-02-24 Siliconix Limited Temperature sensing apparatus
JPS63292028A (en) * 1987-05-26 1988-11-29 Nec Corp Electronic-circuit protecting apparatus
JPH02266241A (en) * 1989-04-07 1990-10-31 Nec Corp Temperature detector for logic module
US6679628B2 (en) * 2001-08-14 2004-01-20 Schneider Automation Inc. Solid state temperature measuring device and method
US7048438B2 (en) 2001-08-14 2006-05-23 Schneider Automatic Inc. Solid state temperature measuring device and method

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