JPS5648131A - Ion implantation machine - Google Patents

Ion implantation machine

Info

Publication number
JPS5648131A
JPS5648131A JP12441579A JP12441579A JPS5648131A JP S5648131 A JPS5648131 A JP S5648131A JP 12441579 A JP12441579 A JP 12441579A JP 12441579 A JP12441579 A JP 12441579A JP S5648131 A JPS5648131 A JP S5648131A
Authority
JP
Japan
Prior art keywords
discs
beams
toothed wheel
ion
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12441579A
Other languages
Japanese (ja)
Inventor
Toshimichi Taya
Takeshi Koike
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP12441579A priority Critical patent/JPS5648131A/en
Publication of JPS5648131A publication Critical patent/JPS5648131A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26Bombardment with radiation
    • H01L21/263Bombardment with radiation with high-energy radiation
    • H01L21/265Bombardment with radiation with high-energy radiation producing ion implantation

Landscapes

  • Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)

Abstract

PURPOSE:To implant ions with high-accuracy in a predetermined position through one side of the holes of discs by arranging plural discs at the position overlapping with ion beams. CONSTITUTION:Mass separation is done for ion beams 4 by an electromanget 3. Specific ion species 4' only pass through a gap 6 and the specific ion species scan all the surfaces of wafers 7a by driving 28 the gap 6 for movement. Fine variations in an implantation angle are revised and deflected by an electromagnet 26. A flat toothed wheel 32 is provided at the tip of a pulse motor 30a shaft to rotate a toothed wheel 29 running on the external circumference of a pulse motor 30b shaft and discs 9a are rotated through a fitting plate 33a installed on the toothed wheel 29. Predetermined amounts of ions are implanted in the surfaces of plural wafers 7a by rotating the discs 9a at a constant speed and by scanning the beams 4 in a radius direction. Each disc 9a has a bigger hole than each wafer on the same circumference with each wafer to stop the hole at the passing position of the beams 4. In this composition, ion implantation will be performed with high-accuracy and productivity will be increased.
JP12441579A 1979-09-27 1979-09-27 Ion implantation machine Pending JPS5648131A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12441579A JPS5648131A (en) 1979-09-27 1979-09-27 Ion implantation machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12441579A JPS5648131A (en) 1979-09-27 1979-09-27 Ion implantation machine

Publications (1)

Publication Number Publication Date
JPS5648131A true JPS5648131A (en) 1981-05-01

Family

ID=14884903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12441579A Pending JPS5648131A (en) 1979-09-27 1979-09-27 Ion implantation machine

Country Status (1)

Country Link
JP (1) JPS5648131A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR970052144A (en) * 1995-12-26 1997-07-29 김주용 Helical beam ion implanter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR970052144A (en) * 1995-12-26 1997-07-29 김주용 Helical beam ion implanter

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