JPS5613649A - Correcting method and device for astigmatism in scanning type electron microscope and the like - Google Patents

Correcting method and device for astigmatism in scanning type electron microscope and the like

Info

Publication number
JPS5613649A
JPS5613649A JP8840979A JP8840979A JPS5613649A JP S5613649 A JPS5613649 A JP S5613649A JP 8840979 A JP8840979 A JP 8840979A JP 8840979 A JP8840979 A JP 8840979A JP S5613649 A JPS5613649 A JP S5613649A
Authority
JP
Japan
Prior art keywords
astigmatism
correcting
horizontal
vertical scanning
coils
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8840979A
Other languages
English (en)
Japanese (ja)
Inventor
Takashi Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Akashi Seisakusho KK
Original Assignee
Akashi Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akashi Seisakusho KK filed Critical Akashi Seisakusho KK
Priority to JP8840979A priority Critical patent/JPS5613649A/ja
Priority to DE3025830A priority patent/DE3025830C2/de
Priority to GB8022332A priority patent/GB2058525B/en
Priority to US06/167,134 priority patent/US4321468A/en
Priority to FR8015522A priority patent/FR2461353A1/fr
Publication of JPS5613649A publication Critical patent/JPS5613649A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
JP8840979A 1979-07-12 1979-07-12 Correcting method and device for astigmatism in scanning type electron microscope and the like Pending JPS5613649A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP8840979A JPS5613649A (en) 1979-07-12 1979-07-12 Correcting method and device for astigmatism in scanning type electron microscope and the like
DE3025830A DE3025830C2 (de) 1979-07-12 1980-07-08 Verfahren und Vorrichtung zur Korrektur von Astigmatismus bei Raster-Elektronenmikroskopen und dergleichen
GB8022332A GB2058525B (en) 1979-07-12 1980-07-08 Correction of astigmatism in scanning electron microscopes and similar equipment
US06/167,134 US4321468A (en) 1979-07-12 1980-07-09 Method and apparatus for correcting astigmatism in scanning electron microscopes and similar equipment
FR8015522A FR2461353A1 (fr) 1979-07-12 1980-07-11 Procede et dispositif pour corriger l'astigmatisme dans des microscopes electroniques a balayage et equipements analogues

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8840979A JPS5613649A (en) 1979-07-12 1979-07-12 Correcting method and device for astigmatism in scanning type electron microscope and the like

Publications (1)

Publication Number Publication Date
JPS5613649A true JPS5613649A (en) 1981-02-10

Family

ID=13941993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8840979A Pending JPS5613649A (en) 1979-07-12 1979-07-12 Correcting method and device for astigmatism in scanning type electron microscope and the like

Country Status (5)

Country Link
US (1) US4321468A (Direct)
JP (1) JPS5613649A (Direct)
DE (1) DE3025830C2 (Direct)
FR (1) FR2461353A1 (Direct)
GB (1) GB2058525B (Direct)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5949161A (ja) * 1982-09-14 1984-03-21 Nippon Denso Co Ltd 有機電池
US4721691A (en) * 1983-10-31 1988-01-26 Shin Nihon Chemical Industry Co., Ltd. Magnesia clinker and method of producing the same
JPH0547332A (ja) * 1991-08-20 1993-02-26 Nikon Corp 荷電粒子線装置
JP2015026431A (ja) * 2013-07-24 2015-02-05 日本電子株式会社 球面収差補正装置、球面収差補正方法、および荷電粒子線装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56147350A (en) * 1980-04-16 1981-11-16 Nichidenshi Tekunikusu:Kk Correction method and performing device of astigmatism
JP2835097B2 (ja) * 1989-09-21 1998-12-14 株式会社東芝 荷電ビームの非点収差補正方法
US5107113A (en) * 1990-12-26 1992-04-21 Bell Communications Research, Inc. Method and apparatus for correcting distortions in scanning tunneling microscope images
JP2010078478A (ja) * 2008-09-26 2010-04-08 Toshiba Corp 欠陥検査装置および欠陥検査方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1325540A (en) * 1969-10-10 1973-08-01 Texas Instruments Ltd Electron beam apparatus
JPS4922768B1 (Direct) * 1970-09-11 1974-06-11
JPS521869B2 (Direct) * 1972-07-11 1977-01-18
US4180738A (en) * 1977-07-30 1979-12-25 National Research Development Corporation Astigmatism in electron beam probe instruments
JPS5492050A (en) * 1977-12-29 1979-07-20 Jeol Ltd Method and apparatus for astigmatic correction of scanning electronic microscope and others
US4162403A (en) * 1978-07-26 1979-07-24 Advanced Metals Research Corp. Method and means for compensating for charge carrier beam astigmatism

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5949161A (ja) * 1982-09-14 1984-03-21 Nippon Denso Co Ltd 有機電池
US4721691A (en) * 1983-10-31 1988-01-26 Shin Nihon Chemical Industry Co., Ltd. Magnesia clinker and method of producing the same
JPH0547332A (ja) * 1991-08-20 1993-02-26 Nikon Corp 荷電粒子線装置
JP2015026431A (ja) * 2013-07-24 2015-02-05 日本電子株式会社 球面収差補正装置、球面収差補正方法、および荷電粒子線装置

Also Published As

Publication number Publication date
FR2461353A1 (fr) 1981-01-30
GB2058525A (en) 1981-04-08
DE3025830C2 (de) 1984-05-17
US4321468A (en) 1982-03-23
FR2461353B1 (Direct) 1983-12-16
DE3025830A1 (de) 1981-01-15
GB2058525B (en) 1983-07-20

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