JPS56120935A - Inspecting device for lens array - Google Patents
Inspecting device for lens arrayInfo
- Publication number
- JPS56120935A JPS56120935A JP2548480A JP2548480A JPS56120935A JP S56120935 A JPS56120935 A JP S56120935A JP 2548480 A JP2548480 A JP 2548480A JP 2548480 A JP2548480 A JP 2548480A JP S56120935 A JPS56120935 A JP S56120935A
- Authority
- JP
- Japan
- Prior art keywords
- horizontal plane
- scanning element
- rectangular
- inspected
- lens array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000007787 solid Substances 0.000 abstract 3
- 238000007689 inspection Methods 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2548480A JPS56120935A (en) | 1980-02-29 | 1980-02-29 | Inspecting device for lens array |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2548480A JPS56120935A (en) | 1980-02-29 | 1980-02-29 | Inspecting device for lens array |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56120935A true JPS56120935A (en) | 1981-09-22 |
JPS6341016B2 JPS6341016B2 (enrdf_load_stackoverflow) | 1988-08-15 |
Family
ID=12167322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2548480A Granted JPS56120935A (en) | 1980-02-29 | 1980-02-29 | Inspecting device for lens array |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56120935A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101140178B1 (ko) * | 2009-12-14 | 2012-04-24 | 한국표준과학연구원 | 광학계 성능측정 시스템 및 그 방법 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04260519A (ja) * | 1991-02-18 | 1992-09-16 | Kubota Corp | スクリューフィーダ |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5178261A (ja) * | 1974-12-27 | 1976-07-07 | Ricoh Kk | Fukugoketsuzokogakukeinoseinokensahoho oyobi sonosochi |
JPS5520420A (en) * | 1978-07-29 | 1980-02-13 | Ricoh Co Ltd | Mtf examination unit |
-
1980
- 1980-02-29 JP JP2548480A patent/JPS56120935A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5178261A (ja) * | 1974-12-27 | 1976-07-07 | Ricoh Kk | Fukugoketsuzokogakukeinoseinokensahoho oyobi sonosochi |
JPS5520420A (en) * | 1978-07-29 | 1980-02-13 | Ricoh Co Ltd | Mtf examination unit |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101140178B1 (ko) * | 2009-12-14 | 2012-04-24 | 한국표준과학연구원 | 광학계 성능측정 시스템 및 그 방법 |
Also Published As
Publication number | Publication date |
---|---|
JPS6341016B2 (enrdf_load_stackoverflow) | 1988-08-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5128550A (en) | Method of and an apparatus for testing large area panes for optical quality | |
ATE221650T1 (de) | Optisches verfahren und vorrichtung zum erkennen von fehlstellen | |
EP0249799A3 (en) | Apparatus for inspecting components of transparent material as to surface defects and inclusions | |
US3814943A (en) | Method of and apparatus for analysing patterns and inspecting objects | |
US4800282A (en) | Apparatus and method for detecting residual organic compounds | |
JPS56120935A (en) | Inspecting device for lens array | |
JPS55103729A (en) | Electron beam ringraphic device | |
GB1328877A (en) | Apparatus and method for optically inspecting the physical condition of a surface | |
JPH0478200B2 (enrdf_load_stackoverflow) | ||
JPS5635419A (en) | Pattern inspection device | |
JPS57128834A (en) | Inspecting apparatus of foreign substance | |
JPS5749844A (en) | Inspecting device for defect of circuit pattern on printed circuit board | |
JPS5610201A (en) | Object dimension measuring device | |
JPS564004A (en) | System for detecting minute defects of body | |
JPS56118647A (en) | Flaw inspecting apparatus | |
JPS5388782A (en) | Method of inspecting abnormality of surface of long material | |
JPS5614935A (en) | Surface defect detecting method | |
JPS5465595A (en) | Defect inspector | |
JPS5764488A (en) | Laser working device | |
JPS57168384A (en) | Detecting method for shape of object | |
JPS56126745A (en) | Automatic inspecting device for surface of plate material | |
CN205229065U (zh) | 一种多层石墨烯污点检测系统 | |
JPS5480794A (en) | Method of presetting vertical position of sample for x ray microanalyzer | |
JPS5572804A (en) | Pattern check system | |
JPS6488240A (en) | Inspection of photosensitive material |