JPS56120935A - Inspecting device for lens array - Google Patents
Inspecting device for lens arrayInfo
- Publication number
- JPS56120935A JPS56120935A JP2548480A JP2548480A JPS56120935A JP S56120935 A JPS56120935 A JP S56120935A JP 2548480 A JP2548480 A JP 2548480A JP 2548480 A JP2548480 A JP 2548480A JP S56120935 A JPS56120935 A JP S56120935A
- Authority
- JP
- Japan
- Prior art keywords
- horizontal plane
- scanning element
- rectangular
- inspected
- lens array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
PURPOSE:To perform inspection efficiently by providing a light source movable in the direction (z) and a chart plate rotatable within a horizontal plane above the lens array movable in the directions (x) and (y) within a horizontal plane and also providing a solid scanning element capable of movement and rotation within a horizontal plane below the array. CONSTITUTION:The shading direction of the rectangular-wave chart 46 and the longitudinal direction of the solid scanning element 52 are set in the direction (y) within a horizontal plane and adjustment is made by rotating knobs 58a, 59a, 59b, 60a, etc. so that an image of the rectangular-wave chart 46 made by a light source 51 is formed on the solid scanning element 52. A step motor 170 being driven, the lens array 2 to be inspected located on a moving block 14 is moved bit by bit in the direction (x) and the distribution of luminous energy is detected by a scanning element array. By subjecting a detection signal thus obtained to operation processing in an operation circuit, MFT can be inspected. Moreover, by rotating the rectangular-wave chart 46 within a horizontal plane by means of a lever 50, MFT in each direction can be inspected. In this way, the inspection can be carried out efficiently.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2548480A JPS56120935A (en) | 1980-02-29 | 1980-02-29 | Inspecting device for lens array |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2548480A JPS56120935A (en) | 1980-02-29 | 1980-02-29 | Inspecting device for lens array |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56120935A true JPS56120935A (en) | 1981-09-22 |
JPS6341016B2 JPS6341016B2 (en) | 1988-08-15 |
Family
ID=12167322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2548480A Granted JPS56120935A (en) | 1980-02-29 | 1980-02-29 | Inspecting device for lens array |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56120935A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101140178B1 (en) * | 2009-12-14 | 2012-04-24 | 한국표준과학연구원 | Optical performance evaluation system and method using thereof |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04260519A (en) * | 1991-02-18 | 1992-09-16 | Kubota Corp | Screw feeder |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5178261A (en) * | 1974-12-27 | 1976-07-07 | Ricoh Kk | FUKUGOKETSUZOKOGAKUKEINOSEINOKENSAHOHO OYOBI SONOSOCHI |
JPS5520420A (en) * | 1978-07-29 | 1980-02-13 | Ricoh Co Ltd | Mtf examination unit |
-
1980
- 1980-02-29 JP JP2548480A patent/JPS56120935A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5178261A (en) * | 1974-12-27 | 1976-07-07 | Ricoh Kk | FUKUGOKETSUZOKOGAKUKEINOSEINOKENSAHOHO OYOBI SONOSOCHI |
JPS5520420A (en) * | 1978-07-29 | 1980-02-13 | Ricoh Co Ltd | Mtf examination unit |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101140178B1 (en) * | 2009-12-14 | 2012-04-24 | 한국표준과학연구원 | Optical performance evaluation system and method using thereof |
Also Published As
Publication number | Publication date |
---|---|
JPS6341016B2 (en) | 1988-08-15 |
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