JPS56111270A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS56111270A JPS56111270A JP1243880A JP1243880A JPS56111270A JP S56111270 A JPS56111270 A JP S56111270A JP 1243880 A JP1243880 A JP 1243880A JP 1243880 A JP1243880 A JP 1243880A JP S56111270 A JPS56111270 A JP S56111270A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- film
- gaas
- energy rays
- photoreceiving element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 239000013078 crystal Substances 0.000 abstract 1
- 238000002425 crystallisation Methods 0.000 abstract 1
- 230000008025 crystallization Effects 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
- 238000002347 injection Methods 0.000 abstract 1
- 239000007924 injection Substances 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 239000002245 particle Substances 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
- 230000008016 vaporization Effects 0.000 abstract 1
- 238000009834 vaporization Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
- H01L31/0687—Multiple junction or tandem solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/544—Solar cells from Group III-V materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Abstract
PURPOSE:To enable realization of a multilayer structure wherein different kinds of semiconductors required for a highly efficient photoreceiving element and the like are composed in an ohmic contact and to facilitate crystallization thereof by applying energy rays such as light and electron beams thereto. CONSTITUTION:A metal film 6 of In is provided on an n<+> P structure of Si, whereon a p type GaAs layer 2b and an SiO2 film 4 as a film for preventing vaporization of GaAs are further formed sequentially. Subsequently, by scanning the surface side of the layer 2b by means of energy rays 7 such as laser beams, the layer 2b and the film 6 are melted and resolidified in a short time, whereby a contact layer 3 is formed. Simultaneously, the layer 2b is made to be a layer of single crystal or polycrystal having a large diameter of particle. Following to this, S as n type impurity for GaAs is made to pass through the film 4 for injection of an ion into the layer 2b, thereby an n<+> type GaAs layer being formed. In this way, the photoreceiving element of high efficiency can be realized.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1243880A JPS56111270A (en) | 1980-02-06 | 1980-02-06 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1243880A JPS56111270A (en) | 1980-02-06 | 1980-02-06 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56111270A true JPS56111270A (en) | 1981-09-02 |
Family
ID=11805301
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1243880A Pending JPS56111270A (en) | 1980-02-06 | 1980-02-06 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56111270A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0177172A2 (en) * | 1984-08-29 | 1986-04-09 | Varian Associates, Inc. | Monolithic semiconductor |
WO2012120869A1 (en) * | 2011-03-07 | 2012-09-13 | 住友化学株式会社 | Semiconductor substrate, semiconductor device, and method for producing semiconductor substrate |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5247673A (en) * | 1975-10-15 | 1977-04-15 | Hitachi Ltd | Process for production of silicon crystal film |
-
1980
- 1980-02-06 JP JP1243880A patent/JPS56111270A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5247673A (en) * | 1975-10-15 | 1977-04-15 | Hitachi Ltd | Process for production of silicon crystal film |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0177172A2 (en) * | 1984-08-29 | 1986-04-09 | Varian Associates, Inc. | Monolithic semiconductor |
WO2012120869A1 (en) * | 2011-03-07 | 2012-09-13 | 住友化学株式会社 | Semiconductor substrate, semiconductor device, and method for producing semiconductor substrate |
US8901605B2 (en) | 2011-03-07 | 2014-12-02 | National Institute Of Advanced Industrial Science And Technology | Semiconductor wafer, semiconductor device, and method of producing semiconductor wafer |
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