JPS57100721A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS57100721A JPS57100721A JP17682980A JP17682980A JPS57100721A JP S57100721 A JPS57100721 A JP S57100721A JP 17682980 A JP17682980 A JP 17682980A JP 17682980 A JP17682980 A JP 17682980A JP S57100721 A JPS57100721 A JP S57100721A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- layer
- semiconductor
- region
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
- H01L21/02675—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth using laser beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02694—Controlling the interface between substrate and epitaxial layer, e.g. by ion implantation followed by annealing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Optics & Photonics (AREA)
- Recrystallisation Techniques (AREA)
Abstract
PURPOSE:To mass-produce semiconductor devices having high performance without automatic doping of impurity from a substrate with a mixture of a single crystal semiconductor layer region and a polycrystalline semiconductor layer region by selectively emitting an energy beam to the semiconductor layers on a single crystal insulating substrate. CONSTITUTION:In the manufacture of a semiconductor, a polycrystalline silicon layer 102 is, for example, laminated by a CVD method on a sapphire substrate 101, silicon ions are implanted to enhance the absorbing effect of the energy beam, and subsequently a laser beam is emitted directly in a spot manner to the region of the layer 102. The emitted part is molten and resolidified in a short time, but since the primary base is a single crystal sapphire substrate 101, it becomes single crystal silicon with the result that the insular single crystal silicon layer 103 of the layer 102 is formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17682980A JPS57100721A (en) | 1980-12-15 | 1980-12-15 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17682980A JPS57100721A (en) | 1980-12-15 | 1980-12-15 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57100721A true JPS57100721A (en) | 1982-06-23 |
Family
ID=16020561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17682980A Pending JPS57100721A (en) | 1980-12-15 | 1980-12-15 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57100721A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5961118A (en) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Manufacture of semiconductor device |
WO1985004731A1 (en) * | 1984-04-09 | 1985-10-24 | Hosiden Electronics Co., Ltd. | Liquid crystal display element and a method of producing the same |
US4552595A (en) * | 1983-05-13 | 1985-11-12 | Oki Electric Industry Co., Ltd. | Method of manufacturing a semiconductor substrate having dielectric regions |
-
1980
- 1980-12-15 JP JP17682980A patent/JPS57100721A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5961118A (en) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Manufacture of semiconductor device |
US4552595A (en) * | 1983-05-13 | 1985-11-12 | Oki Electric Industry Co., Ltd. | Method of manufacturing a semiconductor substrate having dielectric regions |
WO1985004731A1 (en) * | 1984-04-09 | 1985-10-24 | Hosiden Electronics Co., Ltd. | Liquid crystal display element and a method of producing the same |
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