JPS5737852A - Semiconductor integrated circuit and programming method for said circuit - Google Patents
Semiconductor integrated circuit and programming method for said circuitInfo
- Publication number
- JPS5737852A JPS5737852A JP11351280A JP11351280A JPS5737852A JP S5737852 A JPS5737852 A JP S5737852A JP 11351280 A JP11351280 A JP 11351280A JP 11351280 A JP11351280 A JP 11351280A JP S5737852 A JPS5737852 A JP S5737852A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- circuit
- wiring
- high resistance
- connection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76886—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances
- H01L21/76892—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern
- H01L21/76894—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern using a laser, e.g. laser cutting, laser direct writing, laser repair
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Read Only Memory (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
PURPOSE:To improve the degree of freedom of circuit wiring, to facilitate connection and to enhance reliability by forming a semiconductor layer, in which two low resistance sections are disposed facing to each other through a high resistance section, and introducing impurities from an impurity source adjacently arranged to the high resistance section. CONSTITUTION:The wiring consisting of layers such as N<+> type poly Si layers 103, 105 with low resistance are disposed onto a substrate 100, on which the circuit is shaped, through an insulating film 101 adjacent to the N<-> layer (or i layer) 104 with high resistance. The surface with this structure is coated with a film such as a PSG film 102, beams such as laser beams are irradiated from an upper section of the high resistance layer 104, and the N<-> layer (or the i layer) 104 is changed into an N layer 107 with low resistance, thus connecting the wiring 103, 105. Accordingly, the circuit can be connected by a small irradiation energy, the connection is jointly used with the cutting of the wiring layer and a PN junction is shaped through connection. Consequently, the degree of freedom of program wiring can be increased largely.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55113512A JPS5843907B2 (en) | 1980-08-20 | 1980-08-20 | Semiconductor integrated circuit and its circuit programming method |
DE3036869A DE3036869C2 (en) | 1979-10-01 | 1980-09-30 | Semiconductor integrated circuit and circuit activation method |
US06/192,869 US4455495A (en) | 1979-10-01 | 1980-10-01 | Programmable semiconductor integrated circuitry including a programming semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55113512A JPS5843907B2 (en) | 1980-08-20 | 1980-08-20 | Semiconductor integrated circuit and its circuit programming method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5737852A true JPS5737852A (en) | 1982-03-02 |
JPS5843907B2 JPS5843907B2 (en) | 1983-09-29 |
Family
ID=14614209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55113512A Expired JPS5843907B2 (en) | 1979-10-01 | 1980-08-20 | Semiconductor integrated circuit and its circuit programming method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5843907B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5910859A (en) * | 1996-10-01 | 1999-06-08 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US5978137A (en) * | 1996-10-01 | 1999-11-02 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6369946B1 (en) | 1999-09-08 | 2002-04-09 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6384976B1 (en) | 1999-09-28 | 2002-05-07 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6414793B1 (en) | 1999-09-21 | 2002-07-02 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6549337B2 (en) | 1995-01-19 | 2003-04-15 | Canon Kabushiki Kaisha | Binoculars having objectives spaced apart at a fixed distance and adjustable eyepieces |
EP2801856A1 (en) | 2013-04-24 | 2014-11-12 | Kamakura Koki Co., Ltd | Optical image stabilizer |
-
1980
- 1980-08-20 JP JP55113512A patent/JPS5843907B2/en not_active Expired
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6549337B2 (en) | 1995-01-19 | 2003-04-15 | Canon Kabushiki Kaisha | Binoculars having objectives spaced apart at a fixed distance and adjustable eyepieces |
US5910859A (en) * | 1996-10-01 | 1999-06-08 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US5978137A (en) * | 1996-10-01 | 1999-11-02 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6369946B1 (en) | 1999-09-08 | 2002-04-09 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6414793B1 (en) | 1999-09-21 | 2002-07-02 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6384976B1 (en) | 1999-09-28 | 2002-05-07 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
US6515799B2 (en) * | 1999-09-28 | 2003-02-04 | Fuji Photo Optical Co., Ltd. | Image stabilizing apparatus |
EP2801856A1 (en) | 2013-04-24 | 2014-11-12 | Kamakura Koki Co., Ltd | Optical image stabilizer |
Also Published As
Publication number | Publication date |
---|---|
JPS5843907B2 (en) | 1983-09-29 |
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