JPS5516460A - Crystal growing method - Google Patents
Crystal growing methodInfo
- Publication number
- JPS5516460A JPS5516460A JP8956078A JP8956078A JPS5516460A JP S5516460 A JPS5516460 A JP S5516460A JP 8956078 A JP8956078 A JP 8956078A JP 8956078 A JP8956078 A JP 8956078A JP S5516460 A JPS5516460 A JP S5516460A
- Authority
- JP
- Japan
- Prior art keywords
- monocrystal
- ion
- substrate
- voltage
- gaas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8956078A JPS5516460A (en) | 1978-07-21 | 1978-07-21 | Crystal growing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8956078A JPS5516460A (en) | 1978-07-21 | 1978-07-21 | Crystal growing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5516460A true JPS5516460A (en) | 1980-02-05 |
Family
ID=13974198
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8956078A Pending JPS5516460A (en) | 1978-07-21 | 1978-07-21 | Crystal growing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5516460A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107887287A (zh) * | 2016-09-30 | 2018-04-06 | 中芯国际集成电路制造(上海)有限公司 | 测试方法 |
-
1978
- 1978-07-21 JP JP8956078A patent/JPS5516460A/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107887287A (zh) * | 2016-09-30 | 2018-04-06 | 中芯国际集成电路制造(上海)有限公司 | 测试方法 |
CN107887287B (zh) * | 2016-09-30 | 2020-03-13 | 中芯国际集成电路制造(上海)有限公司 | 测试方法 |
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