JPS55162057A - Method and device for qualitative and quantitative analysis by pattern matching method using computer - Google Patents

Method and device for qualitative and quantitative analysis by pattern matching method using computer

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Publication number
JPS55162057A
JPS55162057A JP6950079A JP6950079A JPS55162057A JP S55162057 A JPS55162057 A JP S55162057A JP 6950079 A JP6950079 A JP 6950079A JP 6950079 A JP6950079 A JP 6950079A JP S55162057 A JPS55162057 A JP S55162057A
Authority
JP
Japan
Prior art keywords
waveform
sample
compound
pattern
qualitative
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6950079A
Other languages
English (en)
Inventor
Hisashi Kusakabe
Tatsuro Ujiie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON KENSA KK
Original Assignee
NIPPON KENSA KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON KENSA KK filed Critical NIPPON KENSA KK
Priority to JP6950079A priority Critical patent/JPS55162057A/ja
Publication of JPS55162057A publication Critical patent/JPS55162057A/ja
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
JP6950079A 1979-06-05 1979-06-05 Method and device for qualitative and quantitative analysis by pattern matching method using computer Pending JPS55162057A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6950079A JPS55162057A (en) 1979-06-05 1979-06-05 Method and device for qualitative and quantitative analysis by pattern matching method using computer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6950079A JPS55162057A (en) 1979-06-05 1979-06-05 Method and device for qualitative and quantitative analysis by pattern matching method using computer

Publications (1)

Publication Number Publication Date
JPS55162057A true JPS55162057A (en) 1980-12-17

Family

ID=13404494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6950079A Pending JPS55162057A (en) 1979-06-05 1979-06-05 Method and device for qualitative and quantitative analysis by pattern matching method using computer

Country Status (1)

Country Link
JP (1) JPS55162057A (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147228A (ja) * 1983-02-12 1984-08-23 Shimadzu Corp スペクトル分解処理装置
JPS59228134A (ja) * 1983-06-10 1984-12-21 Shimadzu Corp スペクトル分解処理装置
JPS6011165A (ja) * 1983-06-30 1985-01-21 Shimadzu Corp 昇温クロマトグラフイ，グラジエントクロマトグラフイ等におけるベ−スラインドリフト補償方法
JPS6053823A (ja) * 1983-09-05 1985-03-27 Hitachi Ltd 分光光度計の合成スペクトル表示装置
JPS60104238A (ja) * 1983-11-10 1985-06-08 Japan Spectroscopic Co 多波長同時検出による定量分析方法
JPS6182169A (ja) * 1985-06-12 1986-04-25 Japan Spectroscopic Co フロ−インジエクシヨン分析法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59147228A (ja) * 1983-02-12 1984-08-23 Shimadzu Corp スペクトル分解処理装置
JPS59228134A (ja) * 1983-06-10 1984-12-21 Shimadzu Corp スペクトル分解処理装置
JPS6011165A (ja) * 1983-06-30 1985-01-21 Shimadzu Corp 昇温クロマトグラフイ，グラジエントクロマトグラフイ等におけるベ−スラインドリフト補償方法
JPS6053823A (ja) * 1983-09-05 1985-03-27 Hitachi Ltd 分光光度計の合成スペクトル表示装置
JPS60104238A (ja) * 1983-11-10 1985-06-08 Japan Spectroscopic Co 多波長同時検出による定量分析方法
JPH0245150B2 (ja) * 1983-11-10 1990-10-08 Nippon Bunko Kogyo Kk
JPS6182169A (ja) * 1985-06-12 1986-04-25 Japan Spectroscopic Co フロ−インジエクシヨン分析法
JPH0536748B2 (ja) * 1985-06-12 1993-05-31 Nippon Bunko Kk

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