JPS55159139A - Signal processing circuit of optic-acoustic analyzer - Google Patents

Signal processing circuit of optic-acoustic analyzer

Info

Publication number
JPS55159139A
JPS55159139A JP6680479A JP6680479A JPS55159139A JP S55159139 A JPS55159139 A JP S55159139A JP 6680479 A JP6680479 A JP 6680479A JP 6680479 A JP6680479 A JP 6680479A JP S55159139 A JPS55159139 A JP S55159139A
Authority
JP
Japan
Prior art keywords
autocorrelation
optic
correlation
output
quantities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6680479A
Other languages
Japanese (ja)
Other versions
JPS6015013B2 (en
Inventor
Atsuo Watanabe
Masahiro Uno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP54066804A priority Critical patent/JPS6015013B2/en
Publication of JPS55159139A publication Critical patent/JPS55159139A/en
Publication of JPS6015013B2 publication Critical patent/JPS6015013B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enhance the degree of freedom of analytic operations by separately calculating the autocorrelations X and Z of the respective outputs on the analysis side and reference side of the analyzer, the correlation Y of the respective outputs and the optic-acoustic output Y/X of light source intensity correction. CONSTITUTION:The autocorrelation of the reference output E0 of the analyzer is operated by a multiplier 14 and the cross-correlations of the reference output E0 and analysis sample output E1 are operated by a multiplier 15. The autocorrelation of the analysis sample output E1 is operated by a multipler 16. Thence, these are simultaneously integrated for a fixed time in constant time integrators 17, 18, 19, whereby the correlation quantity Y and autocorrelation quantities X, Z are obtained. The autocorrelation quantities X, Z are respectively proportional to the square of light source intensities A0, A1 and the correlation quantity Y is proportional to A0A1costheta (theta is a phase difference). Thence, the autocorrelation quantity X and correlation quantity Y are supplied to a divider 30, from which the optic-acoustic output I1=Y/X of light source intensity correction is fetched. Since the respective correlation quantities X, Y, Z and the optic-acoustic output I1 are fetched separately and are supplied to the necessary dividers, etc. according to analysis applications in this way, the degree of freedom of analytical operations may be enhanced.
JP54066804A 1979-05-31 1979-05-31 Photoacoustic analyzer signal processing circuit Expired JPS6015013B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54066804A JPS6015013B2 (en) 1979-05-31 1979-05-31 Photoacoustic analyzer signal processing circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54066804A JPS6015013B2 (en) 1979-05-31 1979-05-31 Photoacoustic analyzer signal processing circuit

Publications (2)

Publication Number Publication Date
JPS55159139A true JPS55159139A (en) 1980-12-11
JPS6015013B2 JPS6015013B2 (en) 1985-04-17

Family

ID=13326412

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54066804A Expired JPS6015013B2 (en) 1979-05-31 1979-05-31 Photoacoustic analyzer signal processing circuit

Country Status (1)

Country Link
JP (1) JPS6015013B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61120041A (en) * 1984-11-16 1986-06-07 Yoshinori Sugitani Correlation photoacoustic imaging method
JP2015028476A (en) * 2013-07-05 2015-02-12 独立行政法人海上技術安全研究所 Detection device for sulfide mineral fine particle using optoacoustic effect, detection method for sulfide mineral fine particle and method for investigating or monitoring sulfide mineral
WO2024024309A1 (en) * 2022-07-28 2024-02-01 コニカミノルタ株式会社 Nondestructive inspecting device, nondestructive inspecting method, and program

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61120041A (en) * 1984-11-16 1986-06-07 Yoshinori Sugitani Correlation photoacoustic imaging method
JPH0446374B2 (en) * 1984-11-16 1992-07-29 Yoshinori Sugitani
JP2015028476A (en) * 2013-07-05 2015-02-12 独立行政法人海上技術安全研究所 Detection device for sulfide mineral fine particle using optoacoustic effect, detection method for sulfide mineral fine particle and method for investigating or monitoring sulfide mineral
WO2024024309A1 (en) * 2022-07-28 2024-02-01 コニカミノルタ株式会社 Nondestructive inspecting device, nondestructive inspecting method, and program

Also Published As

Publication number Publication date
JPS6015013B2 (en) 1985-04-17

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