JPS55156362A - Complementary mos semiconductor device and manufacture thereof - Google Patents
Complementary mos semiconductor device and manufacture thereofInfo
- Publication number
- JPS55156362A JPS55156362A JP6419479A JP6419479A JPS55156362A JP S55156362 A JPS55156362 A JP S55156362A JP 6419479 A JP6419479 A JP 6419479A JP 6419479 A JP6419479 A JP 6419479A JP S55156362 A JPS55156362 A JP S55156362A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- prepared
- defectless
- cmos
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
- H01L27/092—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
- H01L27/0927—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors comprising a P-well only in the substrate
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To improve CMOS dynamic characteristic by a method wherein a defectless layer is formed in a semiconductor substrate up to the part shallower than the well layer and deeper than the diffused layer and the recombination center (high density microscopic defect) is inside prepared. CONSTITUTION:An n-type Si substrate is heat-treated in O2 at 800 deg.C and in N2 at 1,100 deg.C to make a defectless layer 12 and a recombination central layer 13 with high density microscopic defects inside. Next, a p well layer 14 is prepared by B diffusion and an n channel FET22 and a p<+> contact layer 212 are made as prescrived and also an n layer 11 surface is provided with a p<+> channel FET20 and an n<+> contact layer 211 are prepared. Next, a wiring layer is prepared as described to form CMOS unit. According to said constitution the source and drain are formed in the defectless layer to remarkably lower the interface. Moreover, the electrons injected from the emitter of a parasitic transistor can easily be trapped by the byse layer having a recombination center to prevent the latch-up phenomenon and to gain CMOS of good dynamic characteristic.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6419479A JPS55156362A (en) | 1979-05-24 | 1979-05-24 | Complementary mos semiconductor device and manufacture thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6419479A JPS55156362A (en) | 1979-05-24 | 1979-05-24 | Complementary mos semiconductor device and manufacture thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55156362A true JPS55156362A (en) | 1980-12-05 |
JPS6146064B2 JPS6146064B2 (en) | 1986-10-11 |
Family
ID=13251008
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6419479A Granted JPS55156362A (en) | 1979-05-24 | 1979-05-24 | Complementary mos semiconductor device and manufacture thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55156362A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58143563A (en) * | 1982-02-22 | 1983-08-26 | Hitachi Ltd | Semiconductor device and its manufacture |
JPS6089931A (en) * | 1983-10-24 | 1985-05-20 | Matsushita Electronics Corp | Manufacture of semiconductor device |
US5455437A (en) * | 1991-11-20 | 1995-10-03 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device having crystalline defect isolation regions |
-
1979
- 1979-05-24 JP JP6419479A patent/JPS55156362A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58143563A (en) * | 1982-02-22 | 1983-08-26 | Hitachi Ltd | Semiconductor device and its manufacture |
JPH0241175B2 (en) * | 1982-02-22 | 1990-09-14 | Hitachi Ltd | |
JPS6089931A (en) * | 1983-10-24 | 1985-05-20 | Matsushita Electronics Corp | Manufacture of semiconductor device |
US5455437A (en) * | 1991-11-20 | 1995-10-03 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device having crystalline defect isolation regions |
Also Published As
Publication number | Publication date |
---|---|
JPS6146064B2 (en) | 1986-10-11 |
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