JPS55138666A - Ic testing apparatus - Google Patents

Ic testing apparatus

Info

Publication number
JPS55138666A
JPS55138666A JP4701079A JP4701079A JPS55138666A JP S55138666 A JPS55138666 A JP S55138666A JP 4701079 A JP4701079 A JP 4701079A JP 4701079 A JP4701079 A JP 4701079A JP S55138666 A JPS55138666 A JP S55138666A
Authority
JP
Japan
Prior art keywords
data
pattern
read
address
out times
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4701079A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6228873B2 (enrdf_load_stackoverflow
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP4701079A priority Critical patent/JPS55138666A/ja
Publication of JPS55138666A publication Critical patent/JPS55138666A/ja
Publication of JPS6228873B2 publication Critical patent/JPS6228873B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP4701079A 1979-04-16 1979-04-16 Ic testing apparatus Granted JPS55138666A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4701079A JPS55138666A (en) 1979-04-16 1979-04-16 Ic testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4701079A JPS55138666A (en) 1979-04-16 1979-04-16 Ic testing apparatus

Publications (2)

Publication Number Publication Date
JPS55138666A true JPS55138666A (en) 1980-10-29
JPS6228873B2 JPS6228873B2 (enrdf_load_stackoverflow) 1987-06-23

Family

ID=12763191

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4701079A Granted JPS55138666A (en) 1979-04-16 1979-04-16 Ic testing apparatus

Country Status (1)

Country Link
JP (1) JPS55138666A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60198476A (ja) * 1984-03-23 1985-10-07 Hitachi Ltd アドレスシ−ケンサ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5437435A (en) * 1977-08-29 1979-03-19 Takeda Riken Ind Co Ltd Semiconductor memory tester

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5437435A (en) * 1977-08-29 1979-03-19 Takeda Riken Ind Co Ltd Semiconductor memory tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60198476A (ja) * 1984-03-23 1985-10-07 Hitachi Ltd アドレスシ−ケンサ

Also Published As

Publication number Publication date
JPS6228873B2 (enrdf_load_stackoverflow) 1987-06-23

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