JPS6228873B2 - - Google Patents

Info

Publication number
JPS6228873B2
JPS6228873B2 JP54047010A JP4701079A JPS6228873B2 JP S6228873 B2 JPS6228873 B2 JP S6228873B2 JP 54047010 A JP54047010 A JP 54047010A JP 4701079 A JP4701079 A JP 4701079A JP S6228873 B2 JPS6228873 B2 JP S6228873B2
Authority
JP
Japan
Prior art keywords
pattern
address
data
fail
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54047010A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55138666A (en
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP4701079A priority Critical patent/JPS55138666A/ja
Publication of JPS55138666A publication Critical patent/JPS55138666A/ja
Publication of JPS6228873B2 publication Critical patent/JPS6228873B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP4701079A 1979-04-16 1979-04-16 Ic testing apparatus Granted JPS55138666A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4701079A JPS55138666A (en) 1979-04-16 1979-04-16 Ic testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4701079A JPS55138666A (en) 1979-04-16 1979-04-16 Ic testing apparatus

Publications (2)

Publication Number Publication Date
JPS55138666A JPS55138666A (en) 1980-10-29
JPS6228873B2 true JPS6228873B2 (enrdf_load_stackoverflow) 1987-06-23

Family

ID=12763191

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4701079A Granted JPS55138666A (en) 1979-04-16 1979-04-16 Ic testing apparatus

Country Status (1)

Country Link
JP (1) JPS55138666A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0675097B2 (ja) * 1984-03-23 1994-09-21 株式会社日立製作所 アドレスシ−ケンサ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5437435A (en) * 1977-08-29 1979-03-19 Takeda Riken Ind Co Ltd Semiconductor memory tester

Also Published As

Publication number Publication date
JPS55138666A (en) 1980-10-29

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