JPS55129771A - Semiconductor test unit - Google Patents
Semiconductor test unitInfo
- Publication number
- JPS55129771A JPS55129771A JP3750379A JP3750379A JPS55129771A JP S55129771 A JPS55129771 A JP S55129771A JP 3750379 A JP3750379 A JP 3750379A JP 3750379 A JP3750379 A JP 3750379A JP S55129771 A JPS55129771 A JP S55129771A
- Authority
- JP
- Japan
- Prior art keywords
- test
- section
- semiconductor element
- tested semiconductor
- socket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To increase the operationability and to eanble characteristic measuring test in a short time, by generating the signal through the detection that tested semiconductor element is completely inserted to the socket.
CONSTITUTION: The unit is constituted with the socket section 1 inserting tested semicondcutor element, insertion detection section 3 detecting whether or not the tested semiconductor element is completely inserted to the socket section 1, and tester section 2 performing the characteristic measuring test for the tested semiconductor element. The detection section 3 detects that the tested semiconductor element is completely inserted to the socket section 1 to hold the test start signal STRT at high level. Further, by holding this signal STRT to high level, the tester section 2 executes various characteristic test of tested semiconductor element inserted in the socket section, and the signal TEST held at low level is fed to the detection section 3 during the period of test execution to stop the insertion detection operation. Thus, the test start switch operation and the no-test time up to the test start are made unnecessary.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3750379A JPS55129771A (en) | 1979-03-29 | 1979-03-29 | Semiconductor test unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3750379A JPS55129771A (en) | 1979-03-29 | 1979-03-29 | Semiconductor test unit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55129771A true JPS55129771A (en) | 1980-10-07 |
JPS6136628B2 JPS6136628B2 (en) | 1986-08-19 |
Family
ID=12499317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3750379A Granted JPS55129771A (en) | 1979-03-29 | 1979-03-29 | Semiconductor test unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55129771A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013068474A (en) * | 2011-09-21 | 2013-04-18 | Nec Engineering Ltd | Semiconductor testing apparatus and semiconductor testing method |
-
1979
- 1979-03-29 JP JP3750379A patent/JPS55129771A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013068474A (en) * | 2011-09-21 | 2013-04-18 | Nec Engineering Ltd | Semiconductor testing apparatus and semiconductor testing method |
Also Published As
Publication number | Publication date |
---|---|
JPS6136628B2 (en) | 1986-08-19 |
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