JPS55129771A - Semiconductor test unit - Google Patents

Semiconductor test unit

Info

Publication number
JPS55129771A
JPS55129771A JP3750379A JP3750379A JPS55129771A JP S55129771 A JPS55129771 A JP S55129771A JP 3750379 A JP3750379 A JP 3750379A JP 3750379 A JP3750379 A JP 3750379A JP S55129771 A JPS55129771 A JP S55129771A
Authority
JP
Japan
Prior art keywords
test
section
semiconductor element
tested semiconductor
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3750379A
Other languages
Japanese (ja)
Other versions
JPS6136628B2 (en
Inventor
Kazuhiro Kakihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP3750379A priority Critical patent/JPS55129771A/en
Publication of JPS55129771A publication Critical patent/JPS55129771A/en
Publication of JPS6136628B2 publication Critical patent/JPS6136628B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To increase the operationability and to eanble characteristic measuring test in a short time, by generating the signal through the detection that tested semiconductor element is completely inserted to the socket.
CONSTITUTION: The unit is constituted with the socket section 1 inserting tested semicondcutor element, insertion detection section 3 detecting whether or not the tested semiconductor element is completely inserted to the socket section 1, and tester section 2 performing the characteristic measuring test for the tested semiconductor element. The detection section 3 detects that the tested semiconductor element is completely inserted to the socket section 1 to hold the test start signal STRT at high level. Further, by holding this signal STRT to high level, the tester section 2 executes various characteristic test of tested semiconductor element inserted in the socket section, and the signal TEST held at low level is fed to the detection section 3 during the period of test execution to stop the insertion detection operation. Thus, the test start switch operation and the no-test time up to the test start are made unnecessary.
COPYRIGHT: (C)1980,JPO&Japio
JP3750379A 1979-03-29 1979-03-29 Semiconductor test unit Granted JPS55129771A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3750379A JPS55129771A (en) 1979-03-29 1979-03-29 Semiconductor test unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3750379A JPS55129771A (en) 1979-03-29 1979-03-29 Semiconductor test unit

Publications (2)

Publication Number Publication Date
JPS55129771A true JPS55129771A (en) 1980-10-07
JPS6136628B2 JPS6136628B2 (en) 1986-08-19

Family

ID=12499317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3750379A Granted JPS55129771A (en) 1979-03-29 1979-03-29 Semiconductor test unit

Country Status (1)

Country Link
JP (1) JPS55129771A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013068474A (en) * 2011-09-21 2013-04-18 Nec Engineering Ltd Semiconductor testing apparatus and semiconductor testing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013068474A (en) * 2011-09-21 2013-04-18 Nec Engineering Ltd Semiconductor testing apparatus and semiconductor testing method

Also Published As

Publication number Publication date
JPS6136628B2 (en) 1986-08-19

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