JPS5444880A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5444880A
JPS5444880A JP11206277A JP11206277A JPS5444880A JP S5444880 A JPS5444880 A JP S5444880A JP 11206277 A JP11206277 A JP 11206277A JP 11206277 A JP11206277 A JP 11206277A JP S5444880 A JPS5444880 A JP S5444880A
Authority
JP
Japan
Prior art keywords
film
polycrystal
resistor
atmosphere
resistance value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11206277A
Other languages
Japanese (ja)
Inventor
Takehiko Kubota
Yasutaka Ikushima
Tsutomu Tashiro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP11206277A priority Critical patent/JPS5444880A/en
Publication of JPS5444880A publication Critical patent/JPS5444880A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To obtain a resistor with a desired resistance value utilizing that after conductivity is given by injecting impurity ions into a polycrystal Si film, the resistance value increase through the heating in an atmosphere containing H2, etc., and decreases through the heating in an atmosphere containing no H2.
CONSTITUTION: Onto Si substrate 1, SiO2 film 2 is adhered and on it, polycrystal Si film 3 is stacked, and then, the substrate is heat-treated in an O2 atmosphere in order to make excellent the adhesion of the photo resist film on film 3, thereby converting the only surface layer of film 3 into SiO2 film 4. Next, pattern 5 of the photo resist film is provided and films 4 and 3 are etched and removed selectively to make resistor 3' of Si polycrystal 3 remain; and P type ions are injected via film 4 so that the density peak will be in the center of the thickness of resistor 3'. Afterward, a heat treatment in an N2 atmosphere at 700 to 1,000°C makes it active to obtain a high resistance, and then, a heat treatment at 400 to 1,000°C in a gas of H2 or H2 and N2 decreases the resistance value down to a desired value.
COPYRIGHT: (C)1979,JPO&Japio
JP11206277A 1977-09-16 1977-09-16 Manufacture of semiconductor device Pending JPS5444880A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11206277A JPS5444880A (en) 1977-09-16 1977-09-16 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11206277A JPS5444880A (en) 1977-09-16 1977-09-16 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5444880A true JPS5444880A (en) 1979-04-09

Family

ID=14577082

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11206277A Pending JPS5444880A (en) 1977-09-16 1977-09-16 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5444880A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6074466A (en) * 1983-06-17 1985-04-26 テキサス インスツルメンツ インコ−ポレイテツド Method of producing polysilicon resistance element
JPS61220452A (en) * 1985-03-27 1986-09-30 Nec Corp Manufacture of semiconductor device
JPH01231362A (en) * 1988-03-11 1989-09-14 Sony Corp Manufacture of polycrystal silicon resistance
WO1991010262A1 (en) * 1989-12-26 1991-07-11 Sony Corporation Method of manufacturing semiconductor device
JPH0718791A (en) * 1993-06-30 1995-01-20 Akinobu Sawara Roof tile made of synthetic resin

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6074466A (en) * 1983-06-17 1985-04-26 テキサス インスツルメンツ インコ−ポレイテツド Method of producing polysilicon resistance element
JPH0587986B2 (en) * 1983-06-17 1993-12-20 Texas Instruments Inc
JPS61220452A (en) * 1985-03-27 1986-09-30 Nec Corp Manufacture of semiconductor device
JPH0556661B2 (en) * 1985-03-27 1993-08-20 Nippon Electric Co
JPH01231362A (en) * 1988-03-11 1989-09-14 Sony Corp Manufacture of polycrystal silicon resistance
WO1991010262A1 (en) * 1989-12-26 1991-07-11 Sony Corporation Method of manufacturing semiconductor device
US5356825A (en) * 1989-12-26 1994-10-18 Sony Corporation Method of manufacturing semiconductor devices
JPH0718791A (en) * 1993-06-30 1995-01-20 Akinobu Sawara Roof tile made of synthetic resin

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